Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

Youngchun Youk, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006
DOIs
Publication statusPublished - 2006 Dec 1
EventConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006 - Long Beach, CA, United States
Duration: 2006 May 212006 May 26

Publication series

NameConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

Other

OtherConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006
CountryUnited States
CityLong Beach, CA
Period06/5/2106/5/26

Fingerprint

pinholes
noise measurement
Diffraction
refractivity
microscopy
Confocal microscopy
diffraction
Refractive index

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Youk, Y., & Kim, D. Y. (2006). Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. In Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006 [4628660] (Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006). https://doi.org/10.1109/CLEO.2006.4628660
Youk, Youngchun ; Kim, Dug Young. / Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006. 2006. (Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006).
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title = "Novel technique to remove measurement noise generated by pinhole diffraction phenomenon",
abstract = "We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.",
author = "Youngchun Youk and Kim, {Dug Young}",
year = "2006",
month = "12",
day = "1",
doi = "10.1109/CLEO.2006.4628660",
language = "English",
isbn = "1557528136",
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booktitle = "Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006",

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Youk, Y & Kim, DY 2006, Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. in Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006., 4628660, Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006, Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006, Long Beach, CA, United States, 06/5/21. https://doi.org/10.1109/CLEO.2006.4628660

Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. / Youk, Youngchun; Kim, Dug Young.

Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006. 2006. 4628660 (Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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T1 - Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

AU - Youk, Youngchun

AU - Kim, Dug Young

PY - 2006/12/1

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N2 - We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

AB - We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

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DO - 10.1109/CLEO.2006.4628660

M3 - Conference contribution

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T3 - Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

BT - Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

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Youk Y, Kim DY. Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. In Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006. 2006. 4628660. (Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006). https://doi.org/10.1109/CLEO.2006.4628660