Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

Youngchun Youk, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2006
PublisherOptical Society of America
ISBN (Print)1557528136, 9781557528131
Publication statusPublished - 2006 Jan 1
EventQuantum Electronics and Laser Science Conference, QELS 2006 - Long Beach, CA, United States
Duration: 2006 May 212006 May 21

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2006
CountryUnited States
CityLong Beach, CA
Period06/5/2106/5/21

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Youk, Y., & Kim, D. Y. (2006). Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. In Quantum Electronics and Laser Science Conference, QELS 2006 (Optics InfoBase Conference Papers). Optical Society of America.