Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

Youngchun Youk, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2006
PublisherOptical Society of America
ISBN (Print)1557528136, 9781557528131
Publication statusPublished - 2006 Jan 1
EventQuantum Electronics and Laser Science Conference, QELS 2006 - Long Beach, CA, United States
Duration: 2006 May 212006 May 21

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2006
CountryUnited States
CityLong Beach, CA
Period06/5/2106/5/21

Fingerprint

pinholes
noise measurement
Diffraction
refractivity
microscopy
Confocal microscopy
diffraction
Refractive index

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Youk, Y., & Kim, D. Y. (2006). Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. In Quantum Electronics and Laser Science Conference, QELS 2006 Optical Society of America.
Youk, Youngchun ; Kim, Dug Young. / Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. Quantum Electronics and Laser Science Conference, QELS 2006. Optical Society of America, 2006.
@inproceedings{a04d9f05095c43a6aa08d8bfdab5c584,
title = "Novel technique to remove measurement noise generated by pinhole diffraction phenomenon",
abstract = "We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.",
author = "Youngchun Youk and Kim, {Dug Young}",
year = "2006",
month = "1",
day = "1",
language = "English",
isbn = "1557528136",
booktitle = "Quantum Electronics and Laser Science Conference, QELS 2006",
publisher = "Optical Society of America",

}

Youk, Y & Kim, DY 2006, Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. in Quantum Electronics and Laser Science Conference, QELS 2006. Optical Society of America, Quantum Electronics and Laser Science Conference, QELS 2006, Long Beach, CA, United States, 06/5/21.

Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. / Youk, Youngchun; Kim, Dug Young.

Quantum Electronics and Laser Science Conference, QELS 2006. Optical Society of America, 2006.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

AU - Youk, Youngchun

AU - Kim, Dug Young

PY - 2006/1/1

Y1 - 2006/1/1

N2 - We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

AB - We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

UR - http://www.scopus.com/inward/record.url?scp=84899147170&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899147170&partnerID=8YFLogxK

M3 - Conference contribution

SN - 1557528136

SN - 9781557528131

BT - Quantum Electronics and Laser Science Conference, QELS 2006

PB - Optical Society of America

ER -

Youk Y, Kim DY. Novel technique to remove measurement noise generated by pinhole diffraction phenomenon. In Quantum Electronics and Laser Science Conference, QELS 2006. Optical Society of America. 2006