Abstract
We develop a deep learning algorithm for contour detection with a fully convolutional encoder-decoder network. Different from previous low-level edge detection, our algorithm focuses on detecting higher-level object contours. Our network is trained end-to-end on PASCAL VOC with refined ground truth from inaccurate polygon annotations, yielding much higher precision in object contour detection than previous methods. We find that the learned model generalizes well to unseen object classes from the same supercategories on MS COCO and can match state-of-the-art edge detection on BSDS500 with fine-tuning. By combining with the multiscale combinatorial grouping algorithm, our method can generate high-quality segmented object proposals, which significantly advance the state-of-the-art on PASCAL VOC (improving average recall from 0.62 to 0.67) with a relatively small amount of candidates (~1660 per image).
Original language | English |
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Title of host publication | Proceedings - 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016 |
Publisher | IEEE Computer Society |
Pages | 193-202 |
Number of pages | 10 |
ISBN (Electronic) | 9781467388504 |
DOIs | |
Publication status | Published - 2016 Dec 9 |
Event | 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016 - Las Vegas, United States Duration: 2016 Jun 26 → 2016 Jul 1 |
Publication series
Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
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Volume | 2016-December |
ISSN (Print) | 1063-6919 |
Conference
Conference | 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016 |
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Country/Territory | United States |
City | Las Vegas |
Period | 16/6/26 → 16/7/1 |
Bibliographical note
Funding Information:J. Yang and M.-H. Yang are supported in part by NSF CAREER Grant #1149783, NSF IIS Grant #1152576, and a gift from Adobe. H. Lee is supported in part by NSF CAREER Grant IIS-1453651.
Publisher Copyright:
© 2016 IEEE.
All Science Journal Classification (ASJC) codes
- Software
- Computer Vision and Pattern Recognition