Observation of artifact-free amorphous structure in Cu-Zr-based alloy using transmission electron microscopy

H. J. Chang; E. S. Park; Y. C. Kim; D. H. Kim

doi:10.1016/j.msea.2005.06.017

Observation of artifact-free amorphous structure in Cu-Zr-based alloy using transmission electron microscopy

H. J. Chang, E. S. Park, Y. C. Kim, D. H. Kim

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

The effect of the sample preparation method on the observation of amorphous structure in glass forming Cu-Zr, Cu-Zr-Ti and Cu-Zr-Ti-Ni alloys (Cu-Zr-based alloys) using transmission electron microscopy (TEM) has been investigated. The result shows that the selection of a proper sample preparation method is crucial in observing artifact-free amorphous microstructure, since Cu-Zr-based alloy is readily oxidized in air atmosphere. Electro-chemical thinning or electro-chemical thinning followed by ion milling causes oxide (Cu₂O and CuO) contamination on the surface of the sample. Only low-energy ion milling with liquid nitrogen cooling can result in the observation of a fully amorphous structure. The exposure time of the thin foil sample in air before TEM examination should be minimized to observe the microstructure without contamination.

Original language	English
Pages (from-to)	119-124
Number of pages	6
Journal	Materials Science and Engineering A
Volume	406
Issue number	1-2
DOIs	https://doi.org/10.1016/j.msea.2005.06.017
Publication status	Published - 2005 Oct 15

Bibliographical note

Funding Information:
This work was supported by the Creative Research Initiatives of the Korean Ministry of Science and Technology.

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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title = "Observation of artifact-free amorphous structure in Cu-Zr-based alloy using transmission electron microscopy",

abstract = "The effect of the sample preparation method on the observation of amorphous structure in glass forming Cu-Zr, Cu-Zr-Ti and Cu-Zr-Ti-Ni alloys (Cu-Zr-based alloys) using transmission electron microscopy (TEM) has been investigated. The result shows that the selection of a proper sample preparation method is crucial in observing artifact-free amorphous microstructure, since Cu-Zr-based alloy is readily oxidized in air atmosphere. Electro-chemical thinning or electro-chemical thinning followed by ion milling causes oxide (Cu2O and CuO) contamination on the surface of the sample. Only low-energy ion milling with liquid nitrogen cooling can result in the observation of a fully amorphous structure. The exposure time of the thin foil sample in air before TEM examination should be minimized to observe the microstructure without contamination.",

author = "Chang, {H. J.} and Park, {E. S.} and Kim, {Y. C.} and Kim, {D. H.}",

note = "Funding Information: This work was supported by the Creative Research Initiatives of the Korean Ministry of Science and Technology.",

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AU - Chang, H. J.

AU - Park, E. S.

AU - Kim, Y. C.

AU - Kim, D. H.

N1 - Funding Information: This work was supported by the Creative Research Initiatives of the Korean Ministry of Science and Technology.

PY - 2005/10/15

Y1 - 2005/10/15

N2 - The effect of the sample preparation method on the observation of amorphous structure in glass forming Cu-Zr, Cu-Zr-Ti and Cu-Zr-Ti-Ni alloys (Cu-Zr-based alloys) using transmission electron microscopy (TEM) has been investigated. The result shows that the selection of a proper sample preparation method is crucial in observing artifact-free amorphous microstructure, since Cu-Zr-based alloy is readily oxidized in air atmosphere. Electro-chemical thinning or electro-chemical thinning followed by ion milling causes oxide (Cu2O and CuO) contamination on the surface of the sample. Only low-energy ion milling with liquid nitrogen cooling can result in the observation of a fully amorphous structure. The exposure time of the thin foil sample in air before TEM examination should be minimized to observe the microstructure without contamination.

AB - The effect of the sample preparation method on the observation of amorphous structure in glass forming Cu-Zr, Cu-Zr-Ti and Cu-Zr-Ti-Ni alloys (Cu-Zr-based alloys) using transmission electron microscopy (TEM) has been investigated. The result shows that the selection of a proper sample preparation method is crucial in observing artifact-free amorphous microstructure, since Cu-Zr-based alloy is readily oxidized in air atmosphere. Electro-chemical thinning or electro-chemical thinning followed by ion milling causes oxide (Cu2O and CuO) contamination on the surface of the sample. Only low-energy ion milling with liquid nitrogen cooling can result in the observation of a fully amorphous structure. The exposure time of the thin foil sample in air before TEM examination should be minimized to observe the microstructure without contamination.

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Observation of artifact-free amorphous structure in Cu-Zr-based alloy using transmission electron microscopy

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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