Observation of red-shifted strong surface plasmon scattering in single Cu nanowires

Sang Youp Yim, Hong Gyu Ahn, Koo Chul Je, Moohyun Choi, Chang Woo Park, Honglyoul Ju, Seung Han Park

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Surface plasmon scattering spectra of chemically produced single Cu nanowires were obtained using a total internal reflection microscope. In particular, we have observed a strong surface plasmon peak in the far red and a red-shift of the surface plasmon resonance with increasing nanowire diameter. We believe that the most reasonable origin for the red-shift of comparably large diameter nanowires is the phase retardation effect.

Original languageEnglish
Pages (from-to)10282-10287
Number of pages6
JournalOptics Express
Volume15
Issue number16
DOIs
Publication statusPublished - 2007 Aug 6

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nanowires
red shift
scattering
surface plasmon resonance
microscopes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Yim, Sang Youp ; Ahn, Hong Gyu ; Je, Koo Chul ; Choi, Moohyun ; Park, Chang Woo ; Ju, Honglyoul ; Park, Seung Han. / Observation of red-shifted strong surface plasmon scattering in single Cu nanowires. In: Optics Express. 2007 ; Vol. 15, No. 16. pp. 10282-10287.
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Observation of red-shifted strong surface plasmon scattering in single Cu nanowires. / Yim, Sang Youp; Ahn, Hong Gyu; Je, Koo Chul; Choi, Moohyun; Park, Chang Woo; Ju, Honglyoul; Park, Seung Han.

In: Optics Express, Vol. 15, No. 16, 06.08.2007, p. 10282-10287.

Research output: Contribution to journalArticle

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