Resistive nonvolatile memory (NVM) is considered to be a leading candidate for next-generation memory. However, maintaining a target sensing margin is a challenge with technology scaling because of the increased process variation and decreased read cell current. This paper proposes an offset-canceling current-sampling sense amplifier (OCCS-SA) that is intended for use in deep submicrometer resistive NVM. The proposed OCCS-SA has the three major advantages of: 1) offset voltage cancellation; 2) double sensing margin structure; and 3) strong positive feedback. The measurement results from a 65 nm test chip show that the proposed OCCS-SA achieves 2.4 times faster sensing time (tSEN) at a nominal supply voltage (VDD) of 1.0 V and a greater than 20% reduction in VDD at the same tSEN, compared to the state-of-the-art current-sampling-based SA, which features offset voltage cancellation and weak positive feedback.
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© 2016 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering