Offset-Canceling Single-Ended Sensing Scheme with One-Bit-Line Precharge Architecture for Resistive Nonvolatile Memory in 65-nm CMOS

Taehui Na, Byungkyu Song, Sara Choi, Jung Pill Kim, Seung H. Kang, Seong Ook Jung

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

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Engineering & Materials Science