Optical measurement for the concentrations of the pickling acid with near infrared spectroscopy in steel making industry

Gumin Kang, Kwangchil Lee, Haesung Park, Jinho Lee, Youngjean Jung, Kyoungsik Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In the manufacturing process of stainless steel, it is essential to pickle the oxide layer of steel surface for high corrosion resistance and fine surface quality. Pickling liquor of stainless steel is commonly composed of mixed hydrofluoric and nitric acid. Real time monitoring of concentrations of each acid is crucial to optimize pickling process. It also reduces cost of production and decreases the generation of waste acid. We used non-contact near infrared spectroscopy technique and rapid analysis method, for the quantification of each acid in an on-line manner. Multivariate calibration such as partial least square regression method is employed for the better prediction results.

Original languageEnglish
Title of host publicationReflection, Scattering, and Diffraction from Surfaces II
DOIs
Publication statusPublished - 2010 Oct 25
EventReflection, Scattering, and Diffraction from Surfaces II - San Diego, CA, United States
Duration: 2010 Aug 22010 Aug 4

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7792
ISSN (Print)0277-786X

Other

OtherReflection, Scattering, and Diffraction from Surfaces II
CountryUnited States
CitySan Diego, CA
Period10/8/210/8/4

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kang, G., Lee, K., Park, H., Lee, J., Jung, Y., & Kim, K. (2010). Optical measurement for the concentrations of the pickling acid with near infrared spectroscopy in steel making industry. In Reflection, Scattering, and Diffraction from Surfaces II [77920G] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7792). https://doi.org/10.1117/12.860284