Optical properties and microstructure of CeO2-SiO2 composite thin films

Won Hoe Koo, Soon Moon Jeoung, Sang Hun Choi, Sung Jin Jo, Hong Koo Baik, Se Jong Lee, Kie Moon Song

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

CeO2-SiO2 composite thin films were prepared by e-beam evaporation and ion beam-assisted deposition (IBAD) using an End-Hall ion source. The refractive index of composite thin films exhibited a maximum value at 20-35% SiO2 fraction, indicating the highest packing density. Optical analysis revealed that the transmittance and reflectance spectra of composite films were consistent with the results of the refractive index. The results from X-ray diffractometry (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurements showed that composite thin films containing 20-35% SiO2 concentration had a dense and smooth amorphous surface, compared to the roughened granular structure of the pure SiO2 and CeO2 thin films.

Original languageEnglish
Pages (from-to)28-31
Number of pages4
JournalThin Solid Films
Volume468
Issue number1-2
DOIs
Publication statusPublished - 2004 Dec 1

Fingerprint

Composite films
Optical properties
optical properties
Thin films
microstructure
Microstructure
composite materials
thin films
Refractive index
refractivity
Ion beam assisted deposition
packing density
Ion sources
ion sources
X ray diffraction analysis
Atomic force microscopy
transmittance
Evaporation
ion beams
evaporation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Koo, W. H., Jeoung, S. M., Choi, S. H., Jo, S. J., Baik, H. K., Lee, S. J., & Song, K. M. (2004). Optical properties and microstructure of CeO2-SiO2 composite thin films. Thin Solid Films, 468(1-2), 28-31. https://doi.org/10.1016/j.tsf.2004.03.042
Koo, Won Hoe ; Jeoung, Soon Moon ; Choi, Sang Hun ; Jo, Sung Jin ; Baik, Hong Koo ; Lee, Se Jong ; Song, Kie Moon. / Optical properties and microstructure of CeO2-SiO2 composite thin films. In: Thin Solid Films. 2004 ; Vol. 468, No. 1-2. pp. 28-31.
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Koo, WH, Jeoung, SM, Choi, SH, Jo, SJ, Baik, HK, Lee, SJ & Song, KM 2004, 'Optical properties and microstructure of CeO2-SiO2 composite thin films', Thin Solid Films, vol. 468, no. 1-2, pp. 28-31. https://doi.org/10.1016/j.tsf.2004.03.042

Optical properties and microstructure of CeO2-SiO2 composite thin films. / Koo, Won Hoe; Jeoung, Soon Moon; Choi, Sang Hun; Jo, Sung Jin; Baik, Hong Koo; Lee, Se Jong; Song, Kie Moon.

In: Thin Solid Films, Vol. 468, No. 1-2, 01.12.2004, p. 28-31.

Research output: Contribution to journalArticle

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T1 - Optical properties and microstructure of CeO2-SiO2 composite thin films

AU - Koo, Won Hoe

AU - Jeoung, Soon Moon

AU - Choi, Sang Hun

AU - Jo, Sung Jin

AU - Baik, Hong Koo

AU - Lee, Se Jong

AU - Song, Kie Moon

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AB - CeO2-SiO2 composite thin films were prepared by e-beam evaporation and ion beam-assisted deposition (IBAD) using an End-Hall ion source. The refractive index of composite thin films exhibited a maximum value at 20-35% SiO2 fraction, indicating the highest packing density. Optical analysis revealed that the transmittance and reflectance spectra of composite films were consistent with the results of the refractive index. The results from X-ray diffractometry (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurements showed that composite thin films containing 20-35% SiO2 concentration had a dense and smooth amorphous surface, compared to the roughened granular structure of the pure SiO2 and CeO2 thin films.

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