Optical unwrapping by triple illumination interferometer

Behnam Tayebi, Mohammad Reza Jafarfard, Farnaz Sharif, Young Sik Song, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Here, we present a triple illumination phase interferometer to have a more flexible unwrapping measurement range for single shot optical unwrapping. Three beams of this interferometer illuminate a sample at different incident angles, three phases of the different incident angles are simultaneously recorded using three spatial frequencies. The different direction phases can be used for dual illumination optical unwrapping; as a result, the phase can be unwrapped by more than one measurement range. The feasibility of this technique is demonstrated by measuring a stepped object with heights of 150 and 660 μm. The smaller stepped phase is unwrapped by two measurement range; however, the phase of larger step is wrapped for only one of the measurement range.

Original languageEnglish
Title of host publicationPhotonic Instrumentation Engineering II
EditorsYakov G. Soskind, Craig Olson
PublisherSPIE
ISBN (Electronic)9781628414592
DOIs
Publication statusPublished - 2015 Jan 1
EventPhotonic Instrumentation Engineering II - San Francisco, United States
Duration: 2015 Feb 112015 Feb 12

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9369
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPhotonic Instrumentation Engineering II
CountryUnited States
CitySan Francisco
Period15/2/1115/2/12

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Tayebi, B., Jafarfard, M. R., Sharif, F., Song, Y. S., & Kim, D. Y. (2015). Optical unwrapping by triple illumination interferometer. In Y. G. Soskind, & C. Olson (Eds.), Photonic Instrumentation Engineering II [93690W] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9369). SPIE. https://doi.org/10.1117/12.2079536