### Abstract

Wavelet analysis of voltage sag completely depends on the choice of the wavelet basis. For better detection performance via wavelet analysis, the choice of the optimal wavelet basis must be provided within the constraints of the uncertainty principle which restricts arbitrary assignment of time-frequency resolution. In this paper, we describe local properties of the wavelet basis and voltage sag signal in terms of time duration and frequency bandwidth parameters. After comparison of the local properties of the wavelet basis and voltage sag signal, we suggest a set of performance indexes to measure the time-frequency resolution relation between the wavelet basis and the voltage sag signal. This procedure of determining the optimal wavelet basis can be extended to other possible applications of wavelets.

Original language | English |
---|---|

Pages (from-to) | 873-883 |

Number of pages | 11 |

Journal | Proceedings of SPIE - The International Society for Optical Engineering |

Volume | 3813 |

Publication status | Published - 1999 Dec 1 |

Event | Proceedings of the 1999 Wavelet Applications in Signal and Image Processing VII - Denver, CO, USA Duration: 1999 Jul 19 → 1999 Jul 23 |

### Fingerprint

### All Science Journal Classification (ASJC) codes

- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering

### Cite this

*Proceedings of SPIE - The International Society for Optical Engineering*,

*3813*, 873-883.

}

*Proceedings of SPIE - The International Society for Optical Engineering*, vol. 3813, pp. 873-883.

**Optimal Daubechies' wavelet bases for detection of voltage sags in electric power distribution and transmission systems.** / Shin, Yong June; Powers, Edward J.; Grady, W. M.; Bhatt, S. C.

Research output: Contribution to journal › Conference article

TY - JOUR

T1 - Optimal Daubechies' wavelet bases for detection of voltage sags in electric power distribution and transmission systems

AU - Shin, Yong June

AU - Powers, Edward J.

AU - Grady, W. M.

AU - Bhatt, S. C.

PY - 1999/12/1

Y1 - 1999/12/1

N2 - Wavelet analysis of voltage sag completely depends on the choice of the wavelet basis. For better detection performance via wavelet analysis, the choice of the optimal wavelet basis must be provided within the constraints of the uncertainty principle which restricts arbitrary assignment of time-frequency resolution. In this paper, we describe local properties of the wavelet basis and voltage sag signal in terms of time duration and frequency bandwidth parameters. After comparison of the local properties of the wavelet basis and voltage sag signal, we suggest a set of performance indexes to measure the time-frequency resolution relation between the wavelet basis and the voltage sag signal. This procedure of determining the optimal wavelet basis can be extended to other possible applications of wavelets.

AB - Wavelet analysis of voltage sag completely depends on the choice of the wavelet basis. For better detection performance via wavelet analysis, the choice of the optimal wavelet basis must be provided within the constraints of the uncertainty principle which restricts arbitrary assignment of time-frequency resolution. In this paper, we describe local properties of the wavelet basis and voltage sag signal in terms of time duration and frequency bandwidth parameters. After comparison of the local properties of the wavelet basis and voltage sag signal, we suggest a set of performance indexes to measure the time-frequency resolution relation between the wavelet basis and the voltage sag signal. This procedure of determining the optimal wavelet basis can be extended to other possible applications of wavelets.

UR - http://www.scopus.com/inward/record.url?scp=0033319775&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033319775&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033319775

VL - 3813

SP - 873

EP - 883

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -