Opto-mechatronics issues in solid immersion lens based near-field recording

No Cheol Park, Yong Joong Yoon, Yong Hyun Lee, Joong Gon Kim, Wan Chin Kim, Hyun Choi, Seungho Lim, Tae Man Yang, Moon Ho Choi, Hyunseok Yang, Yoon Chul Rhim, Young Pil Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We analyzed the effects of an external shock on a collision problem in a solid immersion lens (SIL) based near-field recording (NFR) through a shock response analysis and proposed a possible solution to this problem with adopting a protector and safety mode. With this proposed method the collision between SIL and media can be avoided. We showed possible solution for contamination problem in SIL based NFR through a numerical air flow analysis. We also introduced possible solid immersion lens designs to increase the fabrication and assembly tolerances of an optical head with replicated lens. Potentially, these research results could advance NFR technology for commercial product.

Original languageEnglish
Title of host publicationOptical Data Storage 2007
DOIs
Publication statusPublished - 2007 Nov 23
EventOptical Data Storage 2007 - Portland, OR, United States
Duration: 2007 May 202007 May 23

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6620
ISSN (Print)0277-786X

Other

OtherOptical Data Storage 2007
CountryUnited States
CityPortland, OR
Period07/5/2007/5/23

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Park, N. C., Yoon, Y. J., Lee, Y. H., Kim, J. G., Kim, W. C., Choi, H., Lim, S., Yang, T. M., Choi, M. H., Yang, H., Rhim, Y. C., & Park, Y. P. (2007). Opto-mechatronics issues in solid immersion lens based near-field recording. In Optical Data Storage 2007 [66201U] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6620). https://doi.org/10.1117/12.738954