Origin of Device Performance Degradation in InGaZnO Thin-Film Transistors after Crystallization

Byung Du Ahn, Hyun Soo Shin, Dong Lim Kim, Seung Min Lee, Jin Seong Park, Gun Hee Kim, Heon Je Kim

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)
Original languageEnglish
JournalJapanese Journal of Applied Physics
Volume51
Issue number1
Publication statusPublished - 2012 Jan

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