Origin of the metallization of c-axis resistivity upon iodine intercalation into Bi2Sr2CaCu2O8+δ

Jin Ho Choy, Seong Ju Hwang, Sung Ho Hwang, Woo Lee, Dongwoon Jung, Minhyea Lee, Hu Jong Lee

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The origin of the metallization of c-axis resistivity upon intercalation of iodine into Bi2Sr2CaCu2O8+δ has been studied by performing I L1-edge angle-resolved X-ray absorption spectroscopic (XAS) analysis and the tight binding band calculation with the extended Hückel method. According to the polarized I LI-edge XAS analysis, it has become clear that there is a significant anisotropy in the I 5p hole distribution of the intercalated iodine layer. Compared to the E⊥c spectrum, the E//c spectrum shows weaker intensity and higher energy for the white line feature corresponding to the 2s → 5pz transition, indicative of a strong interaction between the BiO layer and the intercalated iodine molecule along the c-axis. Such an interpretation is further supported by the band calculation results showing a significant hybridization between the Bi 6s orbital and the I 5pz one. On the basis of these findings, it is concluded that the orbital overlap between Bi 6s and I 5pz opens a conduction channel along the c-axis, which leads to the metallization of out-of-plane resistivity upon iodine intercalation.

Original languageEnglish
Pages (from-to)5174-5177
Number of pages4
JournalJournal of Physical Chemistry B
Volume105
Issue number22
DOIs
Publication statusPublished - 2001 Jun 7

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Intercalation
Metallizing
Iodine
intercalation
iodine
electrical resistivity
Spectroscopic analysis
X ray absorption
spectroscopic analysis
hole distribution
orbitals
Anisotropy
x rays
conduction
anisotropy
Molecules
molecules
energy

All Science Journal Classification (ASJC) codes

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Choy, Jin Ho ; Hwang, Seong Ju ; Hwang, Sung Ho ; Lee, Woo ; Jung, Dongwoon ; Lee, Minhyea ; Lee, Hu Jong. / Origin of the metallization of c-axis resistivity upon iodine intercalation into Bi2Sr2CaCu2O8+δ. In: Journal of Physical Chemistry B. 2001 ; Vol. 105, No. 22. pp. 5174-5177.
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Origin of the metallization of c-axis resistivity upon iodine intercalation into Bi2Sr2CaCu2O8+δ. / Choy, Jin Ho; Hwang, Seong Ju; Hwang, Sung Ho; Lee, Woo; Jung, Dongwoon; Lee, Minhyea; Lee, Hu Jong.

In: Journal of Physical Chemistry B, Vol. 105, No. 22, 07.06.2001, p. 5174-5177.

Research output: Contribution to journalArticle

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AU - Jung, Dongwoon

AU - Lee, Minhyea

AU - Lee, Hu Jong

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AB - The origin of the metallization of c-axis resistivity upon intercalation of iodine into Bi2Sr2CaCu2O8+δ has been studied by performing I L1-edge angle-resolved X-ray absorption spectroscopic (XAS) analysis and the tight binding band calculation with the extended Hückel method. According to the polarized I LI-edge XAS analysis, it has become clear that there is a significant anisotropy in the I 5p hole distribution of the intercalated iodine layer. Compared to the E⊥c spectrum, the E//c spectrum shows weaker intensity and higher energy for the white line feature corresponding to the 2s → 5pz transition, indicative of a strong interaction between the BiO layer and the intercalated iodine molecule along the c-axis. Such an interpretation is further supported by the band calculation results showing a significant hybridization between the Bi 6s orbital and the I 5pz one. On the basis of these findings, it is concluded that the orbital overlap between Bi 6s and I 5pz opens a conduction channel along the c-axis, which leads to the metallization of out-of-plane resistivity upon iodine intercalation.

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