Oxidation of Chemically‐Vapor‐Deposited Silicon Nitride and Slnglem‐Crystal Silicon

Doo J. Choi, David B. Fischbach, William D. Scott

Research output: Contribution to journalArticlepeer-review

70 Citations (Scopus)

Abstract

Oxidation of {111} single‐crystal silicon and dense, chemically‐vapor‐deposited silicon nitride was done in clean silica tubes at temperatures of 1000° to woo°C. The oxidation rates of silicon nitride under various atmospheres (dry O2, wet O2, wet inert gas, and steam) were several orders of magnitude slower than those of silicon under the identical conditions. The activation energy for the oxidation of silicon nitride decreased from 330 to 259 kJ/mol in going from dry O2 to steam while that for Si decreased from 120 to 94 kJ/mol. The parabolic rate constant for Si increased linearly as the water vapor pressure increased. However, the parabolic rate constant for silicon nitride showed nonlinear dependency on the water vapor pressure in the presence of oxygen. The oxidation kinetics of silicon nitride is explained by the formation of nitrogen compounds (NO and NH3) at the reaction interface and the counterpermeation of these reaction products.

Original languageEnglish
Pages (from-to)1118-1123
Number of pages6
JournalJournal of the American Ceramic Society
Volume72
Issue number7
DOIs
Publication statusPublished - 1989 Jul

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Oxidation of Chemically‐Vapor‐Deposited Silicon Nitride and Slnglem‐Crystal Silicon'. Together they form a unique fingerprint.

Cite this