P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators

Yong Hoon Kim, Min Suk Oh, Kwang Ho Kim, Hyun Jae Kim, Jeong In Han, Sung Kyu Park

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this paper, the effects of back channel passivation on the electrical stability of solution-processed zinc-tin-oxide thin-film transistors (ZTO TFTs) and ring oscillators have been investigated. Based on solution-processed ZTO TFTs, ring oscillators with an oscillation frequency up to 769 kHz were realized and it was found that the passivation layer had a strong influence on the operation stability of the ring oscillators.

Original languageEnglish
Pages (from-to)1166-1169
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume42 1
DOIs
Publication statusPublished - 2011 Jun

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint Dive into the research topics of 'P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators'. Together they form a unique fingerprint.

  • Cite this