Path delay fault diagnosis using path scoring

Lim Yoseop, Lee Joohwan, Kang Sungho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

With the increasing complexity of VLSI devices, more faults have appeared. The process of locating inputoutput in the chip that caused the delay fault is termed as fault diagnosis. In this paper, we propose a path delay fault algorithm using path scoring. The proposed diagnosis utilizes reasoning-based diagnosis technique and at fault diagnosis results to improve diagnosis the of delay-fault diagnosis. We propose a path scoring to increase first-hit-rate (FHR). Experimental results ISCAS85 and full-scan version of ISCAS89 benchmark prove the accuracy of the proposed algorithm.

Original languageEnglish
Title of host publication2008 International SoC Design Conference, ISOCC 2008
Volume2
DOIs
Publication statusPublished - 2008 Dec 1
Event2008 International SoC Design Conference, ISOCC 2008 - Busan, Korea, Republic of
Duration: 2008 Nov 242008 Nov 25

Other

Other2008 International SoC Design Conference, ISOCC 2008
CountryKorea, Republic of
CityBusan
Period08/11/2408/11/25

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Software

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    Yoseop, L., Joohwan, L., & Sungho, K. (2008). Path delay fault diagnosis using path scoring. In 2008 International SoC Design Conference, ISOCC 2008 (Vol. 2). [4815718] https://doi.org/10.1109/SOCDC.2008.4815718