Abstract
With the increasing complexity of VLSI devices, more faults have appeared. The process of locating inputoutput in the chip that caused the delay fault is termed as fault diagnosis. In this paper, we propose a path delay fault algorithm using path scoring. The proposed diagnosis utilizes reasoning-based diagnosis technique and at fault diagnosis results to improve diagnosis the of delay-fault diagnosis. We propose a path scoring to increase first-hit-rate (FHR). Experimental results ISCAS85 and full-scan version of ISCAS89 benchmark prove the accuracy of the proposed algorithm.
| Original language | English |
|---|---|
| Title of host publication | 2008 International SoC Design Conference, ISOCC 2008 |
| Volume | 2 |
| DOIs | |
| Publication status | Published - 2008 Dec 1 |
| Event | 2008 International SoC Design Conference, ISOCC 2008 - Busan, Korea, Republic of Duration: 2008 Nov 24 → 2008 Nov 25 |
Other
| Other | 2008 International SoC Design Conference, ISOCC 2008 |
|---|---|
| Country | Korea, Republic of |
| City | Busan |
| Period | 08/11/24 → 08/11/25 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Software
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Yoseop, L., Joohwan, L., & Sungho, K. (2008). Path delay fault diagnosis using path scoring. In 2008 International SoC Design Conference, ISOCC 2008 (Vol. 2). [4815718] https://doi.org/10.1109/SOCDC.2008.4815718