Pattern recognition in process control

an instrumental variable approach

Kar Ann Toh, R. Devanathan

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

A pattern recognition approach to process identification is proposed in this paper. The process identification problem is first formulated using a nonlinear regression model which is solved according to the nonlinear least squares estimator. The method is then extended via the instrumental variable method to cater for possible correlation of residual error with a Jacobian function. The conditions for the identification are derived. Simulation results are also presented for the methods proposed.

Original languageEnglish
Pages966-970
Number of pages5
Publication statusPublished - 1995 Jan 1
EventProceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2) - Singapore, Singapore
Duration: 1994 Aug 221994 Aug 26

Other

OtherProceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2)
CitySingapore, Singapore
Period94/8/2294/8/26

Fingerprint

Pattern recognition
Process control

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Toh, K. A., & Devanathan, R. (1995). Pattern recognition in process control: an instrumental variable approach. 966-970. Paper presented at Proceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2), Singapore, Singapore, .
Toh, Kar Ann ; Devanathan, R. / Pattern recognition in process control : an instrumental variable approach. Paper presented at Proceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2), Singapore, Singapore, .5 p.
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abstract = "A pattern recognition approach to process identification is proposed in this paper. The process identification problem is first formulated using a nonlinear regression model which is solved according to the nonlinear least squares estimator. The method is then extended via the instrumental variable method to cater for possible correlation of residual error with a Jacobian function. The conditions for the identification are derived. Simulation results are also presented for the methods proposed.",
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Toh, KA & Devanathan, R 1995, 'Pattern recognition in process control: an instrumental variable approach' Paper presented at Proceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2), Singapore, Singapore, 94/8/22 - 94/8/26, pp. 966-970.

Pattern recognition in process control : an instrumental variable approach. / Toh, Kar Ann; Devanathan, R.

1995. 966-970 Paper presented at Proceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2), Singapore, Singapore, .

Research output: Contribution to conferencePaper

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AU - Toh, Kar Ann

AU - Devanathan, R.

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Toh KA, Devanathan R. Pattern recognition in process control: an instrumental variable approach. 1995. Paper presented at Proceedings of the 1994 IEEE Region 10's 9th Annual International Conference (TENCON'94). Part 1 (of 2), Singapore, Singapore, .