Patterning microconductor using nanosecond laser ablation of metal nanoparticle film

Sewoon Han, Taewong Lim, Jaewon Chung, Seung H. Ko, Costas P. Grigoropoulos, Dongjo Kim, Jooho Moon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ablation of metal nanoparticle film using frequency doubled Nd:YAG nanosecond laser is explored to apply for trimming drop on demand (DOD) Inkjet printed electrical micro-conductor for flexible electronics. While elevated rim structure due to expulsion of molten pool is observed in sintered nanoparticle film, the ablation of unsintered nanoparticle film results in a Gaussian-shaped ablation profile, so that a clean precise patterning is possible. In addition, the ablation fluence threshold of unsintered metal nanoparticle film is at least ten times lower than that of a corresponding metal film. Therefore, by using nanosecond laser ablation, inkjet printed metal nanoparticles compatible for flexible polymer can be patterned efficiently with a high resolution.

Original languageEnglish
Title of host publicationPhoton Processing in Microelectronics and Photonics VI
DOIs
Publication statusPublished - 2007 May 21
EventPhoton Processing in Microelectronics and Photonics VI - San Jose, CA, United States
Duration: 2007 Jan 222007 Jan 25

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6458
ISSN (Print)0277-786X

Other

OtherPhoton Processing in Microelectronics and Photonics VI
CountryUnited States
CitySan Jose, CA
Period07/1/2207/1/25

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Han, S., Lim, T., Chung, J., Ko, S. H., Grigoropoulos, C. P., Kim, D., & Moon, J. (2007). Patterning microconductor using nanosecond laser ablation of metal nanoparticle film. In Photon Processing in Microelectronics and Photonics VI [645811] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6458). https://doi.org/10.1117/12.701533