PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE

Young Don Ko; Pyung Moon; Chang Eun Kim; Moon Ho Ham; Jae Min Myoung; Ilgu Yun

doi:10.1109/ISDRS.2007.4422556

PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO₂ thin films grown by MOMBE

Young Don Ko, Pyung Moon, Chang Eun Kim, Moon Ho Ham, Jae Min Myoung, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2007 International Semiconductor Device Research Symposium, ISDRS
DOIs	https://doi.org/10.1109/ISDRS.2007.4422556
Publication status	Published - 2007
Event	2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States Duration: 2007 Dec 12 → 2007 Dec 14

Publication series

Name	2007 International Semiconductor Device Research Symposium, ISDRS

Other

Other	2007 International Semiconductor Device Research Symposium, ISDRS
Country/Territory	United States
City	College Park, MD
Period	07/12/12 → 07/12/14

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/ISDRS.2007.4422556

Cite this

Ko, Y. D., Moon, P., Kim, C. E., Ham, M. H., Myoung, J. M., & Yun, I. (2007). PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO₂ thin films grown by MOMBE. In 2007 International Semiconductor Device Research Symposium, ISDRS [4422556] (2007 International Semiconductor Device Research Symposium, ISDRS). https://doi.org/10.1109/ISDRS.2007.4422556

@inproceedings{4467ddf75df2450a9882613c405a9523,

title = "PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE",

author = "Ko, {Young Don} and Pyung Moon and Kim, {Chang Eun} and Ham, {Moon Ho} and Myoung, {Jae Min} and Ilgu Yun",

year = "2007",

doi = "10.1109/ISDRS.2007.4422556",

language = "English",

isbn = "1424418917",

series = "2007 International Semiconductor Device Research Symposium, ISDRS",

booktitle = "2007 International Semiconductor Device Research Symposium, ISDRS",

note = "2007 International Semiconductor Device Research Symposium, ISDRS ; Conference date: 12-12-2007 Through 14-12-2007",

}

Ko, YD, Moon, P, Kim, CE, Ham, MH, Myoung, JM & Yun, I 2007, PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO₂ thin films grown by MOMBE. in 2007 International Semiconductor Device Research Symposium, ISDRS., 4422556, 2007 International Semiconductor Device Research Symposium, ISDRS, 2007 International Semiconductor Device Research Symposium, ISDRS, College Park, MD, United States, 07/12/12. https://doi.org/10.1109/ISDRS.2007.4422556

PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO₂ thin films grown by MOMBE. / Ko, Young Don; Moon, Pyung; Kim, Chang Eun et al.

2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422556 (2007 International Semiconductor Device Research Symposium, ISDRS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Ham, Moon Ho

AU - Myoung, Jae Min

AU - Yun, Ilgu

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SN - 1424418917

SN - 9781424418916

T3 - 2007 International Semiconductor Device Research Symposium, ISDRS

BT - 2007 International Semiconductor Device Research Symposium, ISDRS

T2 - 2007 International Semiconductor Device Research Symposium, ISDRS

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Ko YD, Moon P, Kim CE, Ham MH, Myoung JM , Yun I. PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO₂ thin films grown by MOMBE. In 2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422556. (2007 International Semiconductor Device Research Symposium, ISDRS). doi: 10.1109/ISDRS.2007.4422556