PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE

Young Don Ko, Pyung Moon, Chang Eun Kim, Moon Ho Ham, Jae Min Myoung, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2007 International Semiconductor Device Research Symposium, ISDRS
DOIs
Publication statusPublished - 2007 Dec 1
Event2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States
Duration: 2007 Dec 122007 Dec 14

Publication series

Name2007 International Semiconductor Device Research Symposium, ISDRS

Other

Other2007 International Semiconductor Device Research Symposium, ISDRS
CountryUnited States
CityCollege Park, MD
Period07/12/1207/12/14

Fingerprint

X ray diffraction
Thin films

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Ko, Y. D., Moon, P., Kim, C. E., Ham, M. H., Myoung, J. M., & Yun, I. (2007). PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE. In 2007 International Semiconductor Device Research Symposium, ISDRS [4422556] (2007 International Semiconductor Device Research Symposium, ISDRS). https://doi.org/10.1109/ISDRS.2007.4422556
Ko, Young Don ; Moon, Pyung ; Kim, Chang Eun ; Ham, Moon Ho ; Myoung, Jae Min ; Yun, Ilgu. / PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE. 2007 International Semiconductor Device Research Symposium, ISDRS. 2007. (2007 International Semiconductor Device Research Symposium, ISDRS).
@inproceedings{4467ddf75df2450a9882613c405a9523,
title = "PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE",
author = "Ko, {Young Don} and Pyung Moon and Kim, {Chang Eun} and Ham, {Moon Ho} and Myoung, {Jae Min} and Ilgu Yun",
year = "2007",
month = "12",
day = "1",
doi = "10.1109/ISDRS.2007.4422556",
language = "English",
isbn = "1424418917",
series = "2007 International Semiconductor Device Research Symposium, ISDRS",
booktitle = "2007 International Semiconductor Device Research Symposium, ISDRS",

}

Ko, YD, Moon, P, Kim, CE, Ham, MH, Myoung, JM & Yun, I 2007, PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE. in 2007 International Semiconductor Device Research Symposium, ISDRS., 4422556, 2007 International Semiconductor Device Research Symposium, ISDRS, 2007 International Semiconductor Device Research Symposium, ISDRS, College Park, MD, United States, 07/12/12. https://doi.org/10.1109/ISDRS.2007.4422556

PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE. / Ko, Young Don; Moon, Pyung; Kim, Chang Eun; Ham, Moon Ho; Myoung, Jae Min; Yun, Ilgu.

2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422556 (2007 International Semiconductor Device Research Symposium, ISDRS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE

AU - Ko, Young Don

AU - Moon, Pyung

AU - Kim, Chang Eun

AU - Ham, Moon Ho

AU - Myoung, Jae Min

AU - Yun, Ilgu

PY - 2007/12/1

Y1 - 2007/12/1

UR - http://www.scopus.com/inward/record.url?scp=44949152570&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=44949152570&partnerID=8YFLogxK

U2 - 10.1109/ISDRS.2007.4422556

DO - 10.1109/ISDRS.2007.4422556

M3 - Conference contribution

AN - SCOPUS:44949152570

SN - 1424418917

SN - 9781424418916

T3 - 2007 International Semiconductor Device Research Symposium, ISDRS

BT - 2007 International Semiconductor Device Research Symposium, ISDRS

ER -

Ko YD, Moon P, Kim CE, Ham MH, Myoung JM, Yun I. PCA-based network modeling using standardized X-ray diffraction data for the electrical characteristics of the HfO2 thin films grown by MOMBE. In 2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422556. (2007 International Semiconductor Device Research Symposium, ISDRS). https://doi.org/10.1109/ISDRS.2007.4422556