Photodetecting properties of ZnO-based thin-film transistors

H. S. Bae, M. H. Yoon, J. H. Kim, Seongil Im

Research output: Contribution to journalArticlepeer-review

183 Citations (Scopus)


The photodetecting properties of ZnO-based thin-film transistors (TFT) was studied at room temperature. The transistors were fabricated on a SiO 2/p-Si substrate by rf magnetron sputtering. The TFTs displayed high photocurrent of more than 10 μA, when illuminated by ultraviolet (UV) and visible photons with energy higher than 2.3eV. The results show that in the channel depletion state with gate bias of -30 V, the photodetecting sensitivity becomes much higher than in the accumulation state.

Original languageEnglish
Pages (from-to)5313-5315
Number of pages3
JournalApplied Physics Letters
Issue number25
Publication statusPublished - 2003 Dec 22

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Photodetecting properties of ZnO-based thin-film transistors'. Together they form a unique fingerprint.

Cite this