Physical-aware gating element insertion for thermal-safe scan shift operation

Taehee Lee; Joon Sung Yang

doi:10.1587/elex.14.20161181

Physical-aware gating element insertion for thermal-safe scan shift operation

Taehee Lee, Joon Sung Yang

College of Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

Original language	English
Article number	20161181
Journal	ieice electronics express
Volume	14
Issue number	7
DOIs	https://doi.org/10.1587/elex.14.20161181
Publication status	Published - 2017 Mar 21

Bibliographical note

Funding Information:
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2015R1D1A1A01058856) and partially supported by Samsung Research Fund.

Publisher Copyright:
© IEICE 2017.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1587/elex.14.20161181

Cite this

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abstract = "Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.",

author = "Taehee Lee and Yang, {Joon Sung}",

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PY - 2017/3/21

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N2 - Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

AB - Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

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Physical-aware gating element insertion for thermal-safe scan shift operation

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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