Physical-aware gating element insertion for thermal-safe scan shift operation

Taehee Lee, Joon Sung Yang

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

Original languageEnglish
Article number20161181
Journalieice electronics express
Volume14
Issue number7
DOIs
Publication statusPublished - 2017 Mar 21

Bibliographical note

Funding Information:
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2015R1D1A1A01058856) and partially supported by Samsung Research Fund.

Publisher Copyright:
© IEICE 2017.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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