Physicochemical analysis of ion beam-induced surface modifications on polyethylene glycol films for liquid crystal alignment

Ju Hwan Lee, Jonghoon Won, Hae Chang Jeong, Dong Hyun Kim, Dong Wook Lee, Jeong Min Han, Byeong Yun Oh, Dae Shik Seo

Research output: Contribution to journalArticle

Abstract

We investigated the surface modification induced by the ion-beam (IB) irradiation of a polyethylene glycol (PEG) film and its liquid crystal (LC) alignment characteristics. The X-ray photoelectron spectroscopy analysis revealed the chemical modification; as the IB incidence angle increased, the number of surface C–O bonds decreased, inducing an anisotropic dipole moment on the PEG film surface. In addition, the physical modification was demonstrated via atomic force microscopy analysis using three-dimensional images as a function of the IB incidence angle. The surface roughness was analyzed; the modification with the smoothest surface was observed for an IB incidence angle of 45°. This modification affected the LC alignment state of the PEG film, as demonstrated by the polarized optical microscopy analysis with pre-tilt angle measurements. Furthermore, for the same IB incidence angle, the residual DC measured using the capacitance–voltage curves was extremely low. Hence, a PEG film irradiated with an IB incidence angle of 45° could be a suitable LC alignment layer.

Original languageEnglish
Pages (from-to)1799-1807
Number of pages9
JournalLiquid Crystals
Volume46
Issue number12
DOIs
Publication statusPublished - 2019 Sep 26

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Liquid Crystals
Liquid crystals
Ion beams
Polyethylene glycols
Surface treatment
glycols
polyethylenes
ion beams
liquid crystals
alignment
incidence
Dipole moment
Chemical modification
Carbon Monoxide
Angle measurement
Optical microscopy
Atomic force microscopy
surface roughness
dipole moments
X ray photoelectron spectroscopy

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Lee, Ju Hwan ; Won, Jonghoon ; Jeong, Hae Chang ; Kim, Dong Hyun ; Lee, Dong Wook ; Han, Jeong Min ; Oh, Byeong Yun ; Seo, Dae Shik. / Physicochemical analysis of ion beam-induced surface modifications on polyethylene glycol films for liquid crystal alignment. In: Liquid Crystals. 2019 ; Vol. 46, No. 12. pp. 1799-1807.
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abstract = "We investigated the surface modification induced by the ion-beam (IB) irradiation of a polyethylene glycol (PEG) film and its liquid crystal (LC) alignment characteristics. The X-ray photoelectron spectroscopy analysis revealed the chemical modification; as the IB incidence angle increased, the number of surface C–O bonds decreased, inducing an anisotropic dipole moment on the PEG film surface. In addition, the physical modification was demonstrated via atomic force microscopy analysis using three-dimensional images as a function of the IB incidence angle. The surface roughness was analyzed; the modification with the smoothest surface was observed for an IB incidence angle of 45°. This modification affected the LC alignment state of the PEG film, as demonstrated by the polarized optical microscopy analysis with pre-tilt angle measurements. Furthermore, for the same IB incidence angle, the residual DC measured using the capacitance–voltage curves was extremely low. Hence, a PEG film irradiated with an IB incidence angle of 45° could be a suitable LC alignment layer.",
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Physicochemical analysis of ion beam-induced surface modifications on polyethylene glycol films for liquid crystal alignment. / Lee, Ju Hwan; Won, Jonghoon; Jeong, Hae Chang; Kim, Dong Hyun; Lee, Dong Wook; Han, Jeong Min; Oh, Byeong Yun; Seo, Dae Shik.

In: Liquid Crystals, Vol. 46, No. 12, 26.09.2019, p. 1799-1807.

Research output: Contribution to journalArticle

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AU - Won, Jonghoon

AU - Jeong, Hae Chang

AU - Kim, Dong Hyun

AU - Lee, Dong Wook

AU - Han, Jeong Min

AU - Oh, Byeong Yun

AU - Seo, Dae Shik

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