Plasmonic nano lithography with a high scan speed contact probe

We demonstrate plasmonic lithography with an optical contact probe to achieve high speed patterning without external gap distance control between the probe and the photoresist. The bottom surface of the probe is covered with a 10 nm thickness silica glass film for the gap distance control and coated with self-assembled monolayer (SAM) to reduce friction between the probe and the photoresist. We achieve a patterning resolution of -50 nm and a patterning speed of -10 mm/s. We obtain the quality of line patterning comparable to that in conventional optical lithography.