Abstract
Summary: Generalizations of the point-optimal panel unit root tests of Moon, Perron and Phillips (MPP) are developed to cover cases of serially correlated errors. The resulting statistics involve two modifications relative to those of MPP: (a) the error variance is replaced by the long-run variance; (b) centring of the statistic is adjusted to correct for second-order bias effects induced by the correlation between the error and lagged dependent variable.
| Original language | English |
|---|---|
| Pages (from-to) | 338-372 |
| Number of pages | 35 |
| Journal | Econometrics Journal |
| Volume | 17 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2014 Oct 1 |
All Science Journal Classification (ASJC) codes
- Economics and Econometrics
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Cite this
Moon, H. R., Perron, B., & Phillips, P. C. B. (2014). Point-optimal panel unit root tests with serially correlated errors. Econometrics Journal, 17(3), 338-372. https://doi.org/10.1111/ectj.12030