Polarization and detection angle dependence of interferometric imaging with scattering near-field scanning optical microscope

Cheng Liu, Seung Han Park

Research output: Contribution to journalArticle

Abstract

Polarized images generated by the scattering near-field scanning optical microscopic interferometer were numerically studied by modeling the interferometer as a coupled point-dipole system. It was shown that, for a given specimen, the resolution of the near-field intensity and phase images were strongly dependent on both the polarization-direction of the reference light and the position of the far-field detector, revealing the strong polarization dependence of the near-field images. In the case of evanescent illumination, highly accurate images could be realized only when the detector was placed at a large enough view angle with the specimen and the reference light was polarized in the detecting-plane, which is vertical to the sample plane and contains both the detection point and the probe-tip

Original languageEnglish
Pages (from-to)6341-6349
Number of pages9
JournalOptics Express
Volume12
Issue number25
DOIs
Publication statusPublished - 2004 Jan 1

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optical microscopes
near fields
scanning
polarization
scattering
interferometers
detectors
polarized light
far fields
illumination
dipoles
probes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

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Polarization and detection angle dependence of interferometric imaging with scattering near-field scanning optical microscope. / Liu, Cheng; Park, Seung Han.

In: Optics Express, Vol. 12, No. 25, 01.01.2004, p. 6341-6349.

Research output: Contribution to journalArticle

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