In this paper, we investigated the position-dependent stress distribution of indium-tin-oxide (ITO) film on a polycarbonate (PC) substrate by applying an external bending force. It was found that crack density is maximum at the center position and decreases toward the edge. In accordance with crack distribution, it was observed that the change is electrical resistivity of ITO islands is maximum at the center and decreases toward the edge. From the result that crack density increases at the same island position as face-plate distance (L) decreases, it is evident that more stress is imposed on the same island position as L decreases.
|Number of pages||4|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Issue number||5 A|
|Publication status||Published - 2004 May|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)