Power quality improving operations of a flux-lock type SFCL integrated with voltage or current controlled-voltage source inverter

Sung Hun Lim, Su Won Lee, Young Hyun Moon, Jae Chul Kim, Tae Kuk Ko

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

In this paper, the flux-lock type superconducting fault current limiter (SFCL) integrated with a voltage source inverter (VSI) controlled with its output voltage or current is proposed and its operations for power quality improvement are investigated. The suggested equipment, which consists of a flux-lock type SFCL and a VSI, can limit the fault current in case that a short-circuit happens by the operation of the flux-lock type SFCL. In addition, it can compensate the reactive power and complement the active power that the non-linear load requires by controlling VSPs output voltage or current and thus, perform the power conditioning operation, the demand side management (DSM) and the uninterruptible power supply (UPS). The specification for the suggested model was determined and its various functions such as the fault current limiting and the power quality improving operations were presented and analysed through the computer simulation. The validity of the analysis was confirmed from the analytical results based on the computer simulation and, the advantage and the limitation of the voltage control and the current control for the VSPs power quality improving operations were discussed.

Original languageEnglish
Article number4510704
Pages (from-to)644-647
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume18
Issue number2
DOIs
Publication statusPublished - 2008 Jun

Bibliographical note

Funding Information:
Manuscript received August 29, 2007. This work was supported by the Soongsil University Research Fund. S.-H. Lim and J.-C. Kim are with the Department of Electrical Engineering, Soongsil University, Seoul 156-743, Korea (e-mail: superlsh73@ssu.ac.kr). S.-W. Lee is with the Institute of TMS Information Technology, Yonsei University, Seoul 120-749, Korea (e-mail: lee_sw91@hanmail.net). Y.-H. Moon and T.-K. Ko are with the School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Korea (e-mail: moon@yonsei.ac. kr). Digital Object Identifier 10.1109/TASC.2008.921317 Fig. 1. Configuration of the flux-lock type SFCL integrated with voltage or current controlled VSI.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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