Precision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres

Seul Ki Yang, J. Lee, Sug-Whan Kim, Hye Young Lee, Jin A. Jeon, I. H. Park, Jae Ryong Yoon, Yang Sik Baek

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

We report a new and improved photon counting method for the precision PDE measurement of SiPM detectors, utilizing two integrating spheres connected serially and calibrated reference detectors. First, using a ray tracing simulation and irradiance measurement results with a reference photodiode, we investigated irradiance characteristics of the measurement instrument, and analyzed dominating systematic uncertainties in PDE measurement. Two SiPM detectors were then used for PDE measurements between wavelengths of 368 and 850 nm and for bias voltages varying from around 70V. The resulting PDEs of the SiPMs show good agreement with those from other studies, yet with an improved accuracy of 1.57% (1σ). This was achieved by the simultaneous measurement with the NIST calibrated reference detectors, which suppressed the time dependent variation of source light. The technical details of the instrumentation, measurement results and uncertainty analysis are reported together with their implications.

Original languageEnglish
Pages (from-to)716-726
Number of pages11
JournalOptics Express
Volume22
Issue number1
DOIs
Publication statusPublished - 2014 Jan 13

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pulse detonation engines
photons
silicon
detectors
irradiance
ray tracing
photodiodes
counting
light sources
electric potential
wavelengths
simulation

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Yang, Seul Ki ; Lee, J. ; Kim, Sug-Whan ; Lee, Hye Young ; Jeon, Jin A. ; Park, I. H. ; Yoon, Jae Ryong ; Baek, Yang Sik. / Precision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres. In: Optics Express. 2014 ; Vol. 22, No. 1. pp. 716-726.
@article{4ea82239ab3742f8aa3d1007f58bd892,
title = "Precision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres",
abstract = "We report a new and improved photon counting method for the precision PDE measurement of SiPM detectors, utilizing two integrating spheres connected serially and calibrated reference detectors. First, using a ray tracing simulation and irradiance measurement results with a reference photodiode, we investigated irradiance characteristics of the measurement instrument, and analyzed dominating systematic uncertainties in PDE measurement. Two SiPM detectors were then used for PDE measurements between wavelengths of 368 and 850 nm and for bias voltages varying from around 70V. The resulting PDEs of the SiPMs show good agreement with those from other studies, yet with an improved accuracy of 1.57{\%} (1σ). This was achieved by the simultaneous measurement with the NIST calibrated reference detectors, which suppressed the time dependent variation of source light. The technical details of the instrumentation, measurement results and uncertainty analysis are reported together with their implications.",
author = "Yang, {Seul Ki} and J. Lee and Sug-Whan Kim and Lee, {Hye Young} and Jeon, {Jin A.} and Park, {I. H.} and Yoon, {Jae Ryong} and Baek, {Yang Sik}",
year = "2014",
month = "1",
day = "13",
doi = "10.1364/OE.22.000716",
language = "English",
volume = "22",
pages = "716--726",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "1",

}

Precision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres. / Yang, Seul Ki; Lee, J.; Kim, Sug-Whan; Lee, Hye Young; Jeon, Jin A.; Park, I. H.; Yoon, Jae Ryong; Baek, Yang Sik.

In: Optics Express, Vol. 22, No. 1, 13.01.2014, p. 716-726.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Precision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres

AU - Yang, Seul Ki

AU - Lee, J.

AU - Kim, Sug-Whan

AU - Lee, Hye Young

AU - Jeon, Jin A.

AU - Park, I. H.

AU - Yoon, Jae Ryong

AU - Baek, Yang Sik

PY - 2014/1/13

Y1 - 2014/1/13

N2 - We report a new and improved photon counting method for the precision PDE measurement of SiPM detectors, utilizing two integrating spheres connected serially and calibrated reference detectors. First, using a ray tracing simulation and irradiance measurement results with a reference photodiode, we investigated irradiance characteristics of the measurement instrument, and analyzed dominating systematic uncertainties in PDE measurement. Two SiPM detectors were then used for PDE measurements between wavelengths of 368 and 850 nm and for bias voltages varying from around 70V. The resulting PDEs of the SiPMs show good agreement with those from other studies, yet with an improved accuracy of 1.57% (1σ). This was achieved by the simultaneous measurement with the NIST calibrated reference detectors, which suppressed the time dependent variation of source light. The technical details of the instrumentation, measurement results and uncertainty analysis are reported together with their implications.

AB - We report a new and improved photon counting method for the precision PDE measurement of SiPM detectors, utilizing two integrating spheres connected serially and calibrated reference detectors. First, using a ray tracing simulation and irradiance measurement results with a reference photodiode, we investigated irradiance characteristics of the measurement instrument, and analyzed dominating systematic uncertainties in PDE measurement. Two SiPM detectors were then used for PDE measurements between wavelengths of 368 and 850 nm and for bias voltages varying from around 70V. The resulting PDEs of the SiPMs show good agreement with those from other studies, yet with an improved accuracy of 1.57% (1σ). This was achieved by the simultaneous measurement with the NIST calibrated reference detectors, which suppressed the time dependent variation of source light. The technical details of the instrumentation, measurement results and uncertainty analysis are reported together with their implications.

UR - http://www.scopus.com/inward/record.url?scp=84892654654&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84892654654&partnerID=8YFLogxK

U2 - 10.1364/OE.22.000716

DO - 10.1364/OE.22.000716

M3 - Article

VL - 22

SP - 716

EP - 726

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 1

ER -