Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD)

W. Lee; H. G. Sohn; J. M. Myoung

doi:10.4028/www.scientific.net/msf.449-452.1245

Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD)

W. Lee, H. G. Sohn, J. M. Myoung

Research output: Contribution to journal › Conference article

15 Citations (Scopus)

Abstract

Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.

Original language	English
Pages (from-to)	1245-1248
Number of pages	4
Journal	Materials Science Forum
Volume	449-452
Issue number	II
DOIs	https://doi.org/10.4028/www.scientific.net/msf.449-452.1245
Publication status	Published - 2004 Jan 1
Event	Designing, Processing and Properties of Advanced Engineering Materials: Proceedings on the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials - Jeju Island, Korea, Republic of Duration: 2003 Nov 5 → 2003 Nov 8

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.4028/www.scientific.net/msf.449-452.1245

Fingerprint Dive into the research topics of 'Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD)'. Together they form a unique fingerprint.

Cite this

Lee, W., Sohn, H. G., & Myoung, J. M. (2004). Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD). Materials Science Forum, 449-452(II), 1245-1248. https://doi.org/10.4028/www.scientific.net/msf.449-452.1245

@article{3c216a92b1b045629c1b746f4c6a0be1,

title = "Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD)",

abstract = "Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.",

author = "W. Lee and Sohn, {H. G.} and Myoung, {J. M.}",

year = "2004",

month = jan,

day = "1",

doi = "10.4028/www.scientific.net/msf.449-452.1245",

language = "English",

volume = "449-452",

pages = "1245--1248",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications",

number = "II",

note = "Designing, Processing and Properties of Advanced Engineering Materials: Proceedings on the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials ; Conference date: 05-11-2003 Through 08-11-2003",

}

TY - JOUR

T1 - Prediction of the structural performances of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapour deposition (MOCVD)

AU - Lee, W.

AU - Sohn, H. G.

AU - Myoung, J. M.

PY - 2004/1/1

Y1 - 2004/1/1

N2 - Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.

AB - Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.

UR - http://www.scopus.com/inward/record.url?scp=18544398629&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18544398629&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/msf.449-452.1245

DO - 10.4028/www.scientific.net/msf.449-452.1245

M3 - Conference article

AN - SCOPUS:18544398629

VL - 449-452

SP - 1245

EP - 1248

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

IS - II

T2 - Designing, Processing and Properties of Advanced Engineering Materials: Proceedings on the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials

Y2 - 5 November 2003 through 8 November 2003

ER -