Probe signal dependence of XPM wavelength converters

Si Mon Shin, Sang Kook Han

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Wavelength conversion makes WDM networks,be efficient and have high capacity. Wavelength converter using cross phase modulation (XPM) is preferred because of small chirp and high efficiency[l][2]. But SOA's used for XPM generates excess noise, i.e. amplified spontaneous emission (ASE) noise. ASE noise is larger than other noises such as shot noise and thermal noise, and dominant cause of power penalty in wavelength conversion[3]. Considering a cascadability wavelength converter for WDM networks, a good quality of the signal after conversion is important. In this paper, the quality of the wavelength converted signal is investigated for probe power variation.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1034-1035
Number of pages2
ISBN (Electronic)0780356616, 9780780356610
DOIs
Publication statusPublished - 1999
Event1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999 - Seoul, Korea, Republic of
Duration: 1999 Aug 301999 Sep 3

Publication series

NameCLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics
Volume3

Other

Other1999 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 1999
CountryKorea, Republic of
CitySeoul
Period99/8/3099/9/3

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Physics and Astronomy(all)

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    Shin, S. M., & Han, S. K. (1999). Probe signal dependence of XPM wavelength converters. In CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics (pp. 1034-1035). [817958] (CLEO/Pacific Rim 1999 - Pacific Rim Conference on Lasers and Electro-Optics; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.1999.817958