Process control via gaze detection technology

Jaihie Kim, Gang Ryung Park, Steven LeClair

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
EditorsMarcello M. Veiga, John A. Meech, Michael H. Smith, Steven R. LeClair
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1263-1269
Number of pages7
ISBN (Electronic)0780354893, 9780780354890
DOIs
Publication statusPublished - 1999 Jan 1
Event2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 - Honolulu, United States
Duration: 1999 Jul 101999 Jul 15

Publication series

NameProceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
Volume2

Other

Other2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
CountryUnited States
CityHonolulu
Period99/7/1099/7/15

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Materials Science (miscellaneous)

Cite this

Kim, J., Park, G. R., & LeClair, S. (1999). Process control via gaze detection technology. In M. M. Veiga, J. A. Meech, M. H. Smith, & S. R. LeClair (Eds.), Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 (pp. 1263-1269). [791556] (Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPMM.1999.791556