Process control via gaze detection technology

Jaihie Kim, Gang Ryung Park, Steven LeClair

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1263-1269
Number of pages7
Volume2
ISBN (Electronic)0780354893, 9780780354890
DOIs
Publication statusPublished - 1999 Jan 1
Event2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 - Honolulu, United States
Duration: 1999 Jul 101999 Jul 15

Other

Other2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
CountryUnited States
CityHonolulu
Period99/7/1099/7/15

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Process control

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Materials Science (miscellaneous)

Cite this

Kim, J., Park, G. R., & LeClair, S. (1999). Process control via gaze detection technology. In Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 (Vol. 2, pp. 1263-1269). [791556] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPMM.1999.791556
Kim, Jaihie ; Park, Gang Ryung ; LeClair, Steven. / Process control via gaze detection technology. Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1999. pp. 1263-1269
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Kim, J, Park, GR & LeClair, S 1999, Process control via gaze detection technology. in Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. vol. 2, 791556, Institute of Electrical and Electronics Engineers Inc., pp. 1263-1269, 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999, Honolulu, United States, 99/7/10. https://doi.org/10.1109/IPMM.1999.791556

Process control via gaze detection technology. / Kim, Jaihie; Park, Gang Ryung; LeClair, Steven.

Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1999. p. 1263-1269 791556.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Kim J, Park GR, LeClair S. Process control via gaze detection technology. In Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. Vol. 2. Institute of Electrical and Electronics Engineers Inc. 1999. p. 1263-1269. 791556 https://doi.org/10.1109/IPMM.1999.791556