Process identification by neuromorphic pattern recognition

Kar Ann Toh; R. Devanathan

Process identification by neuromorphic pattern recognition

Kar Ann Toh, R. Devanathan

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.

Original language	English
Title of host publication	Plenary Session, Emerging Technologies, and Factory Automation
Editors	Anon
Publisher	Publ by IEEE
Pages	349-353
Number of pages	5
ISBN (Print)	0780308913
Publication status	Published - 1993
Event	Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation - Maui, Hawaii, USA Duration: 1993 Nov 15 → 1993 Nov 18

Publication series

Name	IECON Proceedings (Industrial Electronics Conference)
Volume	1

Other

Other	Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation
City	Maui, Hawaii, USA
Period	93/11/15 → 93/11/18

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Electrical and Electronic Engineering

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Cite this

@inproceedings{52718d0802b5443ca633b383558f8d52,

title = "Process identification by neuromorphic pattern recognition",

abstract = "A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.",

author = "Toh, {Kar Ann} and R. Devanathan",

note = "Copyright: Copyright 2004 Elsevier B.V., All rights reserved.; Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation ; Conference date: 15-11-1993 Through 18-11-1993",

year = "1993",

language = "English",

isbn = "0780308913",

series = "IECON Proceedings (Industrial Electronics Conference)",

publisher = "Publ by IEEE",

pages = "349--353",

editor = "Anon",

booktitle = "Plenary Session, Emerging Technologies, and Factory Automation",

}

Toh, KA & Devanathan, R 1993, Process identification by neuromorphic pattern recognition. in Anon (ed.), Plenary Session, Emerging Technologies, and Factory Automation. IECON Proceedings (Industrial Electronics Conference), vol. 1, Publ by IEEE, pp. 349-353, Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation, Maui, Hawaii, USA, 93/11/15.

TY - GEN

T1 - Process identification by neuromorphic pattern recognition

AU - Toh, Kar Ann

AU - Devanathan, R.

PY - 1993

Y1 - 1993

N2 - A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.

AB - A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.

UR - http://www.scopus.com/inward/record.url?scp=0027879608&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027879608&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027879608

SN - 0780308913

T3 - IECON Proceedings (Industrial Electronics Conference)

SP - 349

EP - 353

BT - Plenary Session, Emerging Technologies, and Factory Automation

A2 - Anon, null

PB - Publ by IEEE

T2 - Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation

Y2 - 15 November 1993 through 18 November 1993

ER -