Process identification by neuromorphic pattern recognition

Kar Ann Toh, R. Devanathan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.

Original languageEnglish
Title of host publicationPlenary Session, Emerging Technologies, and Factory Automation
Editors Anon
PublisherPubl by IEEE
Pages349-353
Number of pages5
Volume1
ISBN (Print)0780308913
Publication statusPublished - 1993 Dec 1
EventProceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation - Maui, Hawaii, USA
Duration: 1993 Nov 151993 Nov 18

Other

OtherProceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation
CityMaui, Hawaii, USA
Period93/11/1593/11/18

Fingerprint

Pattern recognition
Neural networks
Controllers

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Toh, K. A., & Devanathan, R. (1993). Process identification by neuromorphic pattern recognition. In Anon (Ed.), Plenary Session, Emerging Technologies, and Factory Automation (Vol. 1, pp. 349-353). Publ by IEEE.
Toh, Kar Ann ; Devanathan, R. / Process identification by neuromorphic pattern recognition. Plenary Session, Emerging Technologies, and Factory Automation. editor / Anon. Vol. 1 Publ by IEEE, 1993. pp. 349-353
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Toh, KA & Devanathan, R 1993, Process identification by neuromorphic pattern recognition. in Anon (ed.), Plenary Session, Emerging Technologies, and Factory Automation. vol. 1, Publ by IEEE, pp. 349-353, Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation, Maui, Hawaii, USA, 93/11/15.

Process identification by neuromorphic pattern recognition. / Toh, Kar Ann; Devanathan, R.

Plenary Session, Emerging Technologies, and Factory Automation. ed. / Anon. Vol. 1 Publ by IEEE, 1993. p. 349-353.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Toh KA, Devanathan R. Process identification by neuromorphic pattern recognition. In Anon, editor, Plenary Session, Emerging Technologies, and Factory Automation. Vol. 1. Publ by IEEE. 1993. p. 349-353