Abstract
A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for on-line process identification.
| Original language | English |
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| Title of host publication | Plenary Session, Emerging Technologies, and Factory Automation |
| Editors | Anon |
| Publisher | Publ by IEEE |
| Pages | 349-353 |
| Number of pages | 5 |
| ISBN (Print) | 0780308913 |
| Publication status | Published - 1993 Dec 1 |
| Event | Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation - Maui, Hawaii, USA Duration: 1993 Nov 15 → 1993 Nov 18 |
Publication series
| Name | IECON Proceedings (Industrial Electronics Conference) |
|---|---|
| Volume | 1 |
Other
| Other | Proceedings of the 19th International Conference on Industrial Electronics, Control and Instrumentation |
|---|---|
| City | Maui, Hawaii, USA |
| Period | 93/11/15 → 93/11/18 |
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All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Electrical and Electronic Engineering
Cite this
Toh, K. A., & Devanathan, R. (1993). Process identification by neuromorphic pattern recognition. In Anon (Ed.), Plenary Session, Emerging Technologies, and Factory Automation (pp. 349-353). (IECON Proceedings (Industrial Electronics Conference); Vol. 1). Publ by IEEE.