Process variation-Aware bridge fault analysis

Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.

Original languageEnglish
Title of host publicationISOCC 2016 - International SoC Design Conference
Subtitle of host publicationSmart SoC for Intelligent Things
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages147-148
Number of pages2
ISBN (Electronic)9781467393089
DOIs
Publication statusPublished - 2016 Dec 27
Event13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of
Duration: 2016 Oct 232016 Oct 26

Other

Other13th International SoC Design Conference, ISOCC 2016
CountryKorea, Republic of
CityJeju
Period16/10/2316/10/26

Fingerprint

Defects
Networks (circuits)
causes
defects

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Kim, H., Choi, I., Lim, J., Oh, H., & Kang, S. (2016). Process variation-Aware bridge fault analysis. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things (pp. 147-148). [7799830] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2016.7799830
Kim, Heetae ; Choi, Inhyuk ; Lim, Jaeil ; Oh, Hyunggoy ; Kang, Sungho. / Process variation-Aware bridge fault analysis. ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 147-148
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Kim, H, Choi, I, Lim, J, Oh, H & Kang, S 2016, Process variation-Aware bridge fault analysis. in ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things., 7799830, Institute of Electrical and Electronics Engineers Inc., pp. 147-148, 13th International SoC Design Conference, ISOCC 2016, Jeju, Korea, Republic of, 16/10/23. https://doi.org/10.1109/ISOCC.2016.7799830

Process variation-Aware bridge fault analysis. / Kim, Heetae; Choi, Inhyuk; Lim, Jaeil; Oh, Hyunggoy; Kang, Sungho.

ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. p. 147-148 7799830.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.

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Kim H, Choi I, Lim J, Oh H, Kang S. Process variation-Aware bridge fault analysis. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc. 2016. p. 147-148. 7799830 https://doi.org/10.1109/ISOCC.2016.7799830