Process variation-Aware bridge fault analysis

Heetae Kim; Inhyuk Choi; Jaeil Lim; Hyunggoy Oh; Sungho Kang

doi:10.1109/ISOCC.2016.7799830

Process variation-Aware bridge fault analysis

Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.

Original language	English
Title of host publication	ISOCC 2016 - International SoC Design Conference
Subtitle of host publication	Smart SoC for Intelligent Things
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	147-148
Number of pages	2
ISBN (Electronic)	9781467393089
DOIs	https://doi.org/10.1109/ISOCC.2016.7799830
Publication status	Published - 2016 Dec 27
Event	13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of Duration: 2016 Oct 23 → 2016 Oct 26

Publication series

Name	ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things

Other

Other	13th International SoC Design Conference, ISOCC 2016
Country/Territory	Korea, Republic of
City	Jeju
Period	16/10/23 → 16/10/26

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/ISOCC.2016.7799830

Cite this

Kim, H., Choi, I., Lim, J., Oh, H., & Kang, S. (2016). Process variation-Aware bridge fault analysis. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things (pp. 147-148). [7799830] (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2016.7799830

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title = "Process variation-Aware bridge fault analysis",

abstract = "Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.",

author = "Heetae Kim and Inhyuk Choi and Jaeil Lim and Hyunggoy Oh and Sungho Kang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 13th International SoC Design Conference, ISOCC 2016 ; Conference date: 23-10-2016 Through 26-10-2016",

year = "2016",

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doi = "10.1109/ISOCC.2016.7799830",

language = "English",

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Kim, H, Choi, I, Lim, J, Oh, H & Kang, S 2016, Process variation-Aware bridge fault analysis. in ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things., 7799830, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things, Institute of Electrical and Electronics Engineers Inc., pp. 147-148, 13th International SoC Design Conference, ISOCC 2016, Jeju, Korea, Republic of, 16/10/23. https://doi.org/10.1109/ISOCC.2016.7799830

Process variation-Aware bridge fault analysis. / Kim, Heetae; Choi, Inhyuk; Lim, Jaeil et al.

ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. p. 147-148 7799830 (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Process variation-Aware bridge fault analysis

AU - Kim, Heetae

AU - Choi, Inhyuk

AU - Lim, Jaeil

AU - Oh, Hyunggoy

AU - Kang, Sungho

PY - 2016/12/27

Y1 - 2016/12/27

N2 - Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.

AB - Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.

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BT - ISOCC 2016 - International SoC Design Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 13th International SoC Design Conference, ISOCC 2016

Y2 - 23 October 2016 through 26 October 2016

ER -

Process variation-Aware bridge fault analysis

Abstract

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