Projective electrical impedance reconstruction with two measurements

Munkh Erdene Ts, Eunjung Lee, Jin Keun Seo, Bastian Harrach, Sungwhan Kim

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

This paper presents a projective reconstruction method of electrical impedance distribution using two boundary measurements of current-voltage data. The proposed method has a major advantage over existing electrical impedance tomography systems: relatively high resolution impedance image in a near-surface region underneath the voltage-sensing probe that is placed on a skin surface. We attach two pairs of electrodes on the border of the probe in such a way that each pair of electrodes generates electrical current flowing underneath the voltage-sensing probe and two currents flow across each other. A careful analysis of the measured data with respect to local perturbation of admittivity leads to the projective reconstruction method and its rationale. Numerical simulations show that the proposed method successfully reconstructs high resolution image of local perturbation of admittivity, due to object position changes or admittivity value changes or the both, in a near-surface region underneath the probe.

Original languageEnglish
Pages (from-to)1659-1675
Number of pages17
JournalSIAM Journal on Applied Mathematics
Volume73
Issue number4
DOIs
Publication statusPublished - 2013 Oct 8

Fingerprint

Acoustic impedance
Impedance
Probe
Voltage
Electrode
Electric potential
Sensing
High Resolution
Perturbation
Electrical Impedance Tomography
Electrodes
Image resolution
Skin
Tomography
Numerical Simulation
Computer simulation

All Science Journal Classification (ASJC) codes

  • Applied Mathematics

Cite this

Ts, Munkh Erdene ; Lee, Eunjung ; Seo, Jin Keun ; Harrach, Bastian ; Kim, Sungwhan. / Projective electrical impedance reconstruction with two measurements. In: SIAM Journal on Applied Mathematics. 2013 ; Vol. 73, No. 4. pp. 1659-1675.
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Projective electrical impedance reconstruction with two measurements. / Ts, Munkh Erdene; Lee, Eunjung; Seo, Jin Keun; Harrach, Bastian; Kim, Sungwhan.

In: SIAM Journal on Applied Mathematics, Vol. 73, No. 4, 08.10.2013, p. 1659-1675.

Research output: Contribution to journalArticle

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