TY - GEN
T1 - Properties of self-assembled monolayer as an anti-adhesion layer on metallic nano stamper
AU - Choi, Sungwoo
AU - Lee, Namseok
AU - Kim, Yonng Joo
AU - Kang, Shinill
PY - 2004
Y1 - 2004
N2 - In the nano replication process, surface quality can be determined by the interfacial phenomena such as the wettability and adhesion force between the metallic stamper and replicated polymeric patterns due to high ratio of surface areas to volume. An experimental method is presented to analyze the temperature dependency on the anti-adhesion property between the stamper and polymer. To analyze the wettability between the stamper and polymer, contact angle of pliable polymer on the metallic stamper was measured at actual molding temperature. To reduce sticking between the stamper and replicated polymeric patterns, SAM (self-assembled monolayer) was applied to the nano replication process as an anti-adhesion layer. Alkanethiol SAM was deposited on nickel surface using solution deposition method. To examine the effectiveness of the SAM deposition on the metallic stamper, contact angle and LFM (Lateral Force Microscopy) were measured.
AB - In the nano replication process, surface quality can be determined by the interfacial phenomena such as the wettability and adhesion force between the metallic stamper and replicated polymeric patterns due to high ratio of surface areas to volume. An experimental method is presented to analyze the temperature dependency on the anti-adhesion property between the stamper and polymer. To analyze the wettability between the stamper and polymer, contact angle of pliable polymer on the metallic stamper was measured at actual molding temperature. To reduce sticking between the stamper and replicated polymeric patterns, SAM (self-assembled monolayer) was applied to the nano replication process as an anti-adhesion layer. Alkanethiol SAM was deposited on nickel surface using solution deposition method. To examine the effectiveness of the SAM deposition on the metallic stamper, contact angle and LFM (Lateral Force Microscopy) were measured.
UR - http://www.scopus.com/inward/record.url?scp=6344226370&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=6344226370&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:6344226370
SN - 0972842276
T3 - 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
SP - 350
EP - 353
BT - 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
A2 - Laudon, M.
A2 - Romanowicz, B.
T2 - 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Y2 - 7 March 2004 through 11 March 2004
ER -