Pulse shortening by RF breakdown in relativistic backward wave oscillator

S. H. Min, H. C. Jung, S. H. Shin, G. S. Park, J. H. An, S. H. Lee, Y. J. Yoon, J. Y. Kim, W. S. Lee, J. H. So

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Relativistic backward wave oscillator (RBWO) is the suitable source for generating high power electromagnetic wave (HPEM). The RBWO has a high efficiency by means of the interaction region between a backward wave and an electron beam. However, the pulse shortening problem occurs frequently in experiments of RBWO because of the RF breakdown on rippled slow wave structure. Experimental study is done 500MW RBWO in progress.

Original languageEnglish
Title of host publication2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC
Pages364-365
Number of pages2
DOIs
Publication statusPublished - 2008 Sep 15
Event2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC - Monterey, CA, United States
Duration: 2008 Apr 222008 Apr 24

Other

Other2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC
CountryUnited States
CityMonterey, CA
Period08/4/2208/4/24

Fingerprint

Slow wave structures
Beam plasma interactions
Electromagnetic waves
Electron beams
Experiments

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Min, S. H., Jung, H. C., Shin, S. H., Park, G. S., An, J. H., Lee, S. H., ... So, J. H. (2008). Pulse shortening by RF breakdown in relativistic backward wave oscillator. In 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC (pp. 364-365). [4556534] https://doi.org/10.1109/IVELEC.2008.4556534
Min, S. H. ; Jung, H. C. ; Shin, S. H. ; Park, G. S. ; An, J. H. ; Lee, S. H. ; Yoon, Y. J. ; Kim, J. Y. ; Lee, W. S. ; So, J. H. / Pulse shortening by RF breakdown in relativistic backward wave oscillator. 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC. 2008. pp. 364-365
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abstract = "Relativistic backward wave oscillator (RBWO) is the suitable source for generating high power electromagnetic wave (HPEM). The RBWO has a high efficiency by means of the interaction region between a backward wave and an electron beam. However, the pulse shortening problem occurs frequently in experiments of RBWO because of the RF breakdown on rippled slow wave structure. Experimental study is done 500MW RBWO in progress.",
author = "Min, {S. H.} and Jung, {H. C.} and Shin, {S. H.} and Park, {G. S.} and An, {J. H.} and Lee, {S. H.} and Yoon, {Y. J.} and Kim, {J. Y.} and Lee, {W. S.} and So, {J. H.}",
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Min, SH, Jung, HC, Shin, SH, Park, GS, An, JH, Lee, SH, Yoon, YJ, Kim, JY, Lee, WS & So, JH 2008, Pulse shortening by RF breakdown in relativistic backward wave oscillator. in 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC., 4556534, pp. 364-365, 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC, Monterey, CA, United States, 08/4/22. https://doi.org/10.1109/IVELEC.2008.4556534

Pulse shortening by RF breakdown in relativistic backward wave oscillator. / Min, S. H.; Jung, H. C.; Shin, S. H.; Park, G. S.; An, J. H.; Lee, S. H.; Yoon, Y. J.; Kim, J. Y.; Lee, W. S.; So, J. H.

2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC. 2008. p. 364-365 4556534.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Min SH, Jung HC, Shin SH, Park GS, An JH, Lee SH et al. Pulse shortening by RF breakdown in relativistic backward wave oscillator. In 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC. 2008. p. 364-365. 4556534 https://doi.org/10.1109/IVELEC.2008.4556534