Quantitative phase imaging method using dual-wavelength Fourier ptychography

Guk Jong Choi, Sungbin Jeon, Jae Yong Lee, Jin Sang Lim, Se Hwan Jang, No Cheol Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fourier ptychography (FP) is a technique which enable to obtain a high-resolution complex image with only intensity images. In this research, we propose dual-wavelength FP scheme for step-height measurement.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging, COSI 2017
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - 2017
EventComputational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States
Duration: 2017 Jun 262017 Jun 29

Publication series

NameOptics InfoBase Conference Papers
VolumePart F46-COSI 2017

Other

OtherComputational Optical Sensing and Imaging, COSI 2017
CountryUnited States
CitySan Francisco
Period17/6/2617/6/29

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint Dive into the research topics of 'Quantitative phase imaging method using dual-wavelength Fourier ptychography'. Together they form a unique fingerprint.

Cite this