Abstract
Fourier ptychography (FP) is a technique which enable to obtain a high-resolution complex image with only intensity images. In this research, we propose dual-wavelength FP scheme for step-height measurement.
| Original language | English |
|---|---|
| Title of host publication | Computational Optical Sensing and Imaging, COSI 2017 |
| Publisher | OSA - The Optical Society |
| ISBN (Electronic) | 9781557528209 |
| DOIs | |
| Publication status | Published - 2017 Jan 1 |
| Event | Computational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States Duration: 2017 Jun 26 → 2017 Jun 29 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| Volume | Part F46-COSI 2017 |
Other
| Other | Computational Optical Sensing and Imaging, COSI 2017 |
|---|---|
| Country | United States |
| City | San Francisco |
| Period | 17/6/26 → 17/6/29 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
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Cite this
Choi, G. J., Jeon, S., Lee, J. Y., Lim, J. S., Jang, S. H., & Park, N. C. (2017). Quantitative phase imaging method using dual-wavelength Fourier ptychography. In Computational Optical Sensing and Imaging, COSI 2017 (Optics InfoBase Conference Papers; Vol. Part F46-COSI 2017). OSA - The Optical Society. https://doi.org/10.1364/COSI.2017.CW3B.4