Quantitative phase imaging method using dual-wavelength Fourier ptychography

Guk Jong Choi, Sungbin Jeon, Jae Yong Lee, Jin Sang Lim, Se Hwan Jang, No Cheol Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fourier ptychography (FP) is a technique which enable to obtain a high-resolution complex image with only intensity images. In this research, we propose dual-wavelength FP scheme for step-height measurement.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging, COSI 2017
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - 2017 Jan 1
EventComputational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States
Duration: 2017 Jun 262017 Jun 29

Publication series

NameOptics InfoBase Conference Papers
VolumePart F46-COSI 2017

Other

OtherComputational Optical Sensing and Imaging, COSI 2017
CountryUnited States
CitySan Francisco
Period17/6/2617/6/29

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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  • Cite this

    Choi, G. J., Jeon, S., Lee, J. Y., Lim, J. S., Jang, S. H., & Park, N. C. (2017). Quantitative phase imaging method using dual-wavelength Fourier ptychography. In Computational Optical Sensing and Imaging, COSI 2017 (Optics InfoBase Conference Papers; Vol. Part F46-COSI 2017). OSA - The Optical Society. https://doi.org/10.1364/COSI.2017.CW3B.4