Quantized Hall resistance measurements at KSRI

K. H. Yoo, K. P. Lee, K. M. Yu, J. C. Park, L. Bliek, G. Hein, H. J. Engelmann, G. Weiman, W. Schlapp

Research output: Contribution to journalConference article

Abstract

The authors describe the system for measuring quantized Hall resistances used at KSRI (Korea Standards Research Institute) and report preliminary results obtained with GaAs-AlGaAs heterostructures. The first result in terms of ΩKSRI is: RH4 = 6453.2(1 + 0.36 × 10-6 ±0.32 × 10-6) ΩKSRI.

Original languageEnglish
Pages (from-to)350-351
Number of pages2
JournalCPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication statusPublished - 1990 Jun 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Electrical and Electronic Engineering

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    Yoo, K. H., Lee, K. P., Yu, K. M., Park, J. C., Bliek, L., Hein, G., Engelmann, H. J., Weiman, G., & Schlapp, W. (1990). Quantized Hall resistance measurements at KSRI. CPEM Digest (Conference on Precision Electromagnetic Measurements), 350-351.