Quantized Hall resistance measurements at KSRI

K. H. Yoo, K. P. Lee, K. M. Yu, J. C. Park, L. Bliek, G. Hein, H. J. Engelmann, G. Weiman, W. Schlapp

Research output: Contribution to journalConference articlepeer-review


The authors describe the system for measuring quantized Hall resistances used at KSRI (Korea Standards Research Institute) and report preliminary results obtained with GaAs-AlGaAs heterostructures. The first result in terms of ΩKSRI is: RH4 = 6453.2(1 + 0.36 × 10-6 ±0.32 × 10-6) ΩKSRI.

Original languageEnglish
Pages (from-to)350-351
Number of pages2
JournalCPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication statusPublished - 1990 Jun
Event1990 Conference on Precision Electromagnetic Measurements - Ottawa, Ont, Can
Duration: 1990 Jun 111990 Jun 14

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Electrical and Electronic Engineering


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