Quenching effects on the solution-processed In-Ga-Zn-O system

Doo Hyun Yoon, Si Joon Kim, Dong Lim Kim, Seung Jin Heo, Hyun Jae Kim

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We investigated quenching effects in solution-processed In-Ga-Zn-O (IGZO). Improved conductivity and crystallinity degradation occurred in quenched IGZO thin-films because of oxygen vacancy generation in a nominal stoichiometric system via defect formation resulting from temperature variation. The optical bandgap was red-shifted in quenched IGZO thin-films due to fluctuations in ionized impurities, such as In4, Ga3, and Zn2, leading to band tailing. Fourier-transform infrared spectra confirmed that quenching effect by liquid nitrogen treatment resulted only from rapid decrement of temperature because there is no generation of chemical bonds during the soaking.

Original languageEnglish
Pages (from-to)E28-E30
JournalElectrochemical and Solid-State Letters
Volume14
Issue number9
DOIs
Publication statusPublished - 2011 Jul 18

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

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