Radiated spurious emission reduction using parasitic element for mobile applications

Tae Wan Koo, Ho Seong Lee, Jong Gwan Yook, Kyungho Yoo, Jeongnam Cheon, Shin Young Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, a quarter wavelength open stub as a parasitic element has been proposed to reduce radiated spurious emissions (RSE) in GSM 1800/1900 networks caused by non-linear devices at the amplifying stage of radio frequency (RF) systems. As the proposed structure is located in a signal line between a front-end module (FEM) and an antenna, it is possible to effectively and additionally suppress harmonic signals below RSE certification test limit. To verify the effect of the proposed structure, the proposed open stub is combined to a planar inverted-F antenna (PIFA) and a low pass filter of the FEM which they are fabricated and measured. The measurement result shows that the radiated powers at 2nd and 3rd harmonic frequency are reduced about 6 to 13 dB while having a reasonable insertion loss of 0.7 dB in a carrier frequency band.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages760-764
Number of pages5
ISBN (Electronic)9781479932252
DOIs
Publication statusPublished - 2014 Oct 20
Event2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014 - Gothenburg, Sweden
Duration: 2014 Sep 12014 Sep 4

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014
CountrySweden
CityGothenburg
Period14/9/114/9/4

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Koo, T. W., Lee, H. S., Yook, J. G., Yoo, K., Cheon, J., & Lee, S. Y. (2014). Radiated spurious emission reduction using parasitic element for mobile applications. In IEEE International Symposium on Electromagnetic Compatibility (pp. 760-764). [6931006] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMCEurope.2014.6931006