Random effects linear models for process mean and variance

So Young Sohn, C. J. Park

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

We consider random effects models for both the mean and variance of a process where some variations in both the mean and variance can be explained by their related covariate effects. Empirical Bayes procedures are employed to estimate covariate effects. Approaches proposed are applied to evaluate the performance of the Phase V sensors of the tactical remote sensor system of the U.S. Marine Corps in terms of their mean and variance of detection distance with respect to target types and sensitivity levels of a sensor.

Original languageEnglish
Pages (from-to)33-39
Number of pages7
JournalJournal of Quality Technology
Volume30
Issue number1
Publication statusPublished - 1998 Jan 1

Fingerprint

Sensors
Random effects
Sensor
Process mean
Covariates
Empirical Bayes
Random effects model

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

Cite this

@article{111c81fb56a8486590a16ba2afa42cc0,
title = "Random effects linear models for process mean and variance",
abstract = "We consider random effects models for both the mean and variance of a process where some variations in both the mean and variance can be explained by their related covariate effects. Empirical Bayes procedures are employed to estimate covariate effects. Approaches proposed are applied to evaluate the performance of the Phase V sensors of the tactical remote sensor system of the U.S. Marine Corps in terms of their mean and variance of detection distance with respect to target types and sensitivity levels of a sensor.",
author = "Sohn, {So Young} and Park, {C. J.}",
year = "1998",
month = "1",
day = "1",
language = "English",
volume = "30",
pages = "33--39",
journal = "Journal of Quality Technology",
issn = "0022-4065",
publisher = "American Society for Quality",
number = "1",

}

Random effects linear models for process mean and variance. / Sohn, So Young; Park, C. J.

In: Journal of Quality Technology, Vol. 30, No. 1, 01.01.1998, p. 33-39.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Random effects linear models for process mean and variance

AU - Sohn, So Young

AU - Park, C. J.

PY - 1998/1/1

Y1 - 1998/1/1

N2 - We consider random effects models for both the mean and variance of a process where some variations in both the mean and variance can be explained by their related covariate effects. Empirical Bayes procedures are employed to estimate covariate effects. Approaches proposed are applied to evaluate the performance of the Phase V sensors of the tactical remote sensor system of the U.S. Marine Corps in terms of their mean and variance of detection distance with respect to target types and sensitivity levels of a sensor.

AB - We consider random effects models for both the mean and variance of a process where some variations in both the mean and variance can be explained by their related covariate effects. Empirical Bayes procedures are employed to estimate covariate effects. Approaches proposed are applied to evaluate the performance of the Phase V sensors of the tactical remote sensor system of the U.S. Marine Corps in terms of their mean and variance of detection distance with respect to target types and sensitivity levels of a sensor.

UR - http://www.scopus.com/inward/record.url?scp=0031704629&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031704629&partnerID=8YFLogxK

M3 - Article

VL - 30

SP - 33

EP - 39

JO - Journal of Quality Technology

JF - Journal of Quality Technology

SN - 0022-4065

IS - 1

ER -