Random super-prism wavelength meter

Michael Mazilu, Tom Vettenburg, Andrea Di Falco, Kishan Dholakia

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

Original languageEnglish
Pages (from-to)96-99
Number of pages4
JournalOptics Letters
Volume39
Issue number1
DOIs
Publication statusPublished - 2014 Jan 1

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speckle patterns
prisms
wavelengths
principal components analysis
scattering
pattern recognition
infrared lasers
laser beams
fibers

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Mazilu, Michael ; Vettenburg, Tom ; Falco, Andrea Di ; Dholakia, Kishan. / Random super-prism wavelength meter. In: Optics Letters. 2014 ; Vol. 39, No. 1. pp. 96-99.
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Mazilu, M, Vettenburg, T, Falco, AD & Dholakia, K 2014, 'Random super-prism wavelength meter', Optics Letters, vol. 39, no. 1, pp. 96-99. https://doi.org/10.1364/OL.39.000096

Random super-prism wavelength meter. / Mazilu, Michael; Vettenburg, Tom; Falco, Andrea Di; Dholakia, Kishan.

In: Optics Letters, Vol. 39, No. 1, 01.01.2014, p. 96-99.

Research output: Contribution to journalArticle

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