Recent progress in cavity ringdown spectroscopy for ultrasensitive detection and quantitative measurement

Jae Yong Lee, Jae Wan Kim, Yong Shim Yoo, Jae Won Hahn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Cavity ringdown spectroscopy (CRDS) enables absorption measurements to be made in a direct and quantitative fashion, permitting remarkable gain in sensitivity over conventional approaches. Developments, applications, and implementation issues of the CRDS technique are presented.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publicationPhotonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages681
Number of pages1
ISBN (Electronic)0780377664
DOIs
Publication statusPublished - 2003
Event5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan, Province of China
Duration: 2003 Dec 152003 Dec 19

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Volume2

Other

Other5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
CountryTaiwan, Province of China
CityTaipei
Period03/12/1503/12/19

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Lee, J. Y., Kim, J. W., Yoo, Y. S., & Hahn, J. W. (2003). Recent progress in cavity ringdown spectroscopy for ultrasensitive detection and quantitative measurement. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings (pp. 681). [1277222] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2003.1277222