Reconfigurable scan architecture for test power and data volume reduction

Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang

Research output: Contribution to journalLetter

1 Citation (Scopus)

Abstract

With exponential development in the semiconductor technology in recent years, the magnitudes of test power consumption and test data volumes have increased significantly. This has resulted in over-testing because of IR drops. This paper proposes a reconfigurable scan architecture to overcome these challenges. The proposed architecture increases the flexibility of the scan partitioning technique to maximize the reduction in the switching activity, and it uses the scan segment skip technique to reduce the data volume. The results show that our method is able to achieve significant reductions in the total test power and data volumes compared with previous methods.

Original languageEnglish
JournalIEICE Electronics Express
Volume14
Issue number13
DOIs
Publication statusPublished - 2017 Jan 1

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Electric power utilization
Semiconductor materials
Testing
flexibility

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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abstract = "With exponential development in the semiconductor technology in recent years, the magnitudes of test power consumption and test data volumes have increased significantly. This has resulted in over-testing because of IR drops. This paper proposes a reconfigurable scan architecture to overcome these challenges. The proposed architecture increases the flexibility of the scan partitioning technique to maximize the reduction in the switching activity, and it uses the scan segment skip technique to reduce the data volume. The results show that our method is able to achieve significant reductions in the total test power and data volumes compared with previous methods.",
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Reconfigurable scan architecture for test power and data volume reduction. / Oh, Hyunggoy; Kim, Heetae; Lim, Jaeil; Kang, Sungho.

In: IEICE Electronics Express, Vol. 14, No. 13, 01.01.2017.

Research output: Contribution to journalLetter

TY - JOUR

T1 - Reconfigurable scan architecture for test power and data volume reduction

AU - Oh, Hyunggoy

AU - Kim, Heetae

AU - Lim, Jaeil

AU - Kang, Sungho

PY - 2017/1/1

Y1 - 2017/1/1

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