Recovery-enhancing task scheduling for multicore processors under NBTI impact

Hyejeong Hong, Jaeil Lim, Sungho Kang

Research output: Contribution to journalLetter

Abstract

Task scheduling for multicore processors typically has aimed at higher throughput and lower power consumption, but the lifetime reliability may be harmed if negative bias temperature instability is not considered together. In this letter, a task scheduling which extends lifetime is proposed. Cores are given the chance to recover as long as performance is not degraded. The degradation simulator shows that the proposed scheduling improves the lifetime of a multicore processor by up to 36% over the existing task scheduling.

Original languageEnglish
Journalieice electronics express
Volume11
Issue number11
DOIs
Publication statusPublished - 2014 May 14

Fingerprint

scheduling
central processing units
recovery
Scheduling
Recovery
life (durability)
simulators
Electric power utilization
Simulators
Throughput
degradation
Degradation
4-nitrobenzylthioinosine
Negative bias temperature instability
temperature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

@article{4273fc1dc51f4385a0181c6b2852b14f,
title = "Recovery-enhancing task scheduling for multicore processors under NBTI impact",
abstract = "Task scheduling for multicore processors typically has aimed at higher throughput and lower power consumption, but the lifetime reliability may be harmed if negative bias temperature instability is not considered together. In this letter, a task scheduling which extends lifetime is proposed. Cores are given the chance to recover as long as performance is not degraded. The degradation simulator shows that the proposed scheduling improves the lifetime of a multicore processor by up to 36{\%} over the existing task scheduling.",
author = "Hyejeong Hong and Jaeil Lim and Sungho Kang",
year = "2014",
month = "5",
day = "14",
doi = "10.1587/elex.11.20140324",
language = "English",
volume = "11",
journal = "IEICE Electronics Express",
issn = "1349-2543",
publisher = "The Institute of Electronics, Information and Communication Engineers (IEICE)",
number = "11",

}

Recovery-enhancing task scheduling for multicore processors under NBTI impact. / Hong, Hyejeong; Lim, Jaeil; Kang, Sungho.

In: ieice electronics express, Vol. 11, No. 11, 14.05.2014.

Research output: Contribution to journalLetter

TY - JOUR

T1 - Recovery-enhancing task scheduling for multicore processors under NBTI impact

AU - Hong, Hyejeong

AU - Lim, Jaeil

AU - Kang, Sungho

PY - 2014/5/14

Y1 - 2014/5/14

N2 - Task scheduling for multicore processors typically has aimed at higher throughput and lower power consumption, but the lifetime reliability may be harmed if negative bias temperature instability is not considered together. In this letter, a task scheduling which extends lifetime is proposed. Cores are given the chance to recover as long as performance is not degraded. The degradation simulator shows that the proposed scheduling improves the lifetime of a multicore processor by up to 36% over the existing task scheduling.

AB - Task scheduling for multicore processors typically has aimed at higher throughput and lower power consumption, but the lifetime reliability may be harmed if negative bias temperature instability is not considered together. In this letter, a task scheduling which extends lifetime is proposed. Cores are given the chance to recover as long as performance is not degraded. The degradation simulator shows that the proposed scheduling improves the lifetime of a multicore processor by up to 36% over the existing task scheduling.

UR - http://www.scopus.com/inward/record.url?scp=84902177128&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84902177128&partnerID=8YFLogxK

U2 - 10.1587/elex.11.20140324

DO - 10.1587/elex.11.20140324

M3 - Letter

AN - SCOPUS:84902177128

VL - 11

JO - IEICE Electronics Express

JF - IEICE Electronics Express

SN - 1349-2543

IS - 11

ER -