Reduced-code test method using sub-histograms for pipelined ADCs

Hyeonuk Son, Jaewon Jang, Heetae Kim, Sungho Kang

Research output: Contribution to journalArticle

Abstract

The measurement of static test parameters for an analog-todigital converter (ADC) requires a large volume of test data, especially for a high-resolution ADC. This paper proposes a reduced-code test method for pipelined ADCs that does not compromise test accuracy. The proposed method calculates fault information at each stage by using sub-histograms. The simulation results based on 12-bit pipelined ADCs show a maximum integral nonlinearity error of 0.590 LSB with only 3.92% of the codes required for the conventional histogram-based method.

Original languageEnglish
Article number20150417
Pages (from-to)1-10
Number of pages10
Journalieice electronics express
Volume12
Issue number12
DOIs
Publication statusPublished - 2015 Jun 25

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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