Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

Keewon Cho, Woosung Lee, Jooyoung Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages128-129
Number of pages2
ISBN (Electronic)9781479951260
DOIs
Publication statusPublished - 2015 Apr 16
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 2014 Nov 32014 Nov 6

Publication series

NameISOCC 2014 - International SoC Design Conference

Other

Other11th International SoC Design Conference, ISOCC 2014
CountryKorea, Republic of
CityJeju
Period14/11/314/11/6

Fingerprint

Costs
Redundancy
Semiconductor materials
Hardware
Data storage equipment
Testing

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

Cite this

Cho, K., Lee, W., Kim, J., & Kang, S. (2015). Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). In ISOCC 2014 - International SoC Design Conference (pp. 128-129). [7087606] (ISOCC 2014 - International SoC Design Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2014.7087606
Cho, Keewon ; Lee, Woosung ; Kim, Jooyoung ; Kang, Sungho. / Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 128-129 (ISOCC 2014 - International SoC Design Conference).
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Cho, K, Lee, W, Kim, J & Kang, S 2015, Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). in ISOCC 2014 - International SoC Design Conference., 7087606, ISOCC 2014 - International SoC Design Conference, Institute of Electrical and Electronics Engineers Inc., pp. 128-129, 11th International SoC Design Conference, ISOCC 2014, Jeju, Korea, Republic of, 14/11/3. https://doi.org/10.1109/ISOCC.2014.7087606

Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). / Cho, Keewon; Lee, Woosung; Kim, Jooyoung; Kang, Sungho.

ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., 2015. p. 128-129 7087606 (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Cho K, Lee W, Kim J, Kang S. Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). In ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc. 2015. p. 128-129. 7087606. (ISOCC 2014 - International SoC Design Conference). https://doi.org/10.1109/ISOCC.2014.7087606