Abstract
In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.
| Original language | English |
|---|---|
| Title of host publication | ISOCC 2014 - International SoC Design Conference |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 128-129 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781479951260 |
| DOIs | |
| Publication status | Published - 2015 Apr 16 |
| Event | 11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of Duration: 2014 Nov 3 → 2014 Nov 6 |
Publication series
| Name | ISOCC 2014 - International SoC Design Conference |
|---|
Other
| Other | 11th International SoC Design Conference, ISOCC 2014 |
|---|---|
| Country | Korea, Republic of |
| City | Jeju |
| Period | 14/11/3 → 14/11/6 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
Cite this
}
Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). / Cho, Keewon; Lee, Woosung; Kim, Jooyoung; Kang, Sungho.
ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., 2015. p. 128-129 7087606 (ISOCC 2014 - International SoC Design Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)
AU - Cho, Keewon
AU - Lee, Woosung
AU - Kim, Jooyoung
AU - Kang, Sungho
PY - 2015/4/16
Y1 - 2015/4/16
N2 - In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.
AB - In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.
UR - http://www.scopus.com/inward/record.url?scp=84929404338&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84929404338&partnerID=8YFLogxK
U2 - 10.1109/ISOCC.2014.7087606
DO - 10.1109/ISOCC.2014.7087606
M3 - Conference contribution
AN - SCOPUS:84929404338
T3 - ISOCC 2014 - International SoC Design Conference
SP - 128
EP - 129
BT - ISOCC 2014 - International SoC Design Conference
PB - Institute of Electrical and Electronics Engineers Inc.
ER -