Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

Keewon Cho; Woosung Lee; Jooyoung Kim; Sungho Kang

doi:10.1109/ISOCC.2014.7087606

Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

Keewon Cho, Woosung Lee, Jooyoung Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.

Original language	English
Title of host publication	ISOCC 2014 - International SoC Design Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	128-129
Number of pages	2
ISBN (Electronic)	9781479951260
DOIs	https://doi.org/10.1109/ISOCC.2014.7087606
Publication status	Published - 2015 Apr 16
Event	11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of Duration: 2014 Nov 3 → 2014 Nov 6

Publication series

Name	ISOCC 2014 - International SoC Design Conference

Other

Other	11th International SoC Design Conference, ISOCC 2014
Country	Korea, Republic of
City	Jeju
Period	14/11/3 → 14/11/6

All Science Journal Classification (ASJC) codes

Hardware and Architecture

Access to Document

10.1109/ISOCC.2014.7087606

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Cho, K., Lee, W., Kim, J., & Kang, S. (2015). Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). In ISOCC 2014 - International SoC Design Conference (pp. 128-129). [7087606] (ISOCC 2014 - International SoC Design Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2014.7087606

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Cho, K, Lee, W, Kim, J & Kang, S 2015, Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). in ISOCC 2014 - International SoC Design Conference., 7087606, ISOCC 2014 - International SoC Design Conference, Institute of Electrical and Electronics Engineers Inc., pp. 128-129, 11th International SoC Design Conference, ISOCC 2014, Jeju, Korea, Republic of, 14/11/3. https://doi.org/10.1109/ISOCC.2014.7087606

Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). / Cho, Keewon; Lee, Woosung; Kim, Jooyoung; Kang, Sungho.

ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., 2015. p. 128-129 7087606 (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.

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Cho K, Lee W, Kim J, Kang S. Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE). In ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc. 2015. p. 128-129. 7087606. (ISOCC 2014 - International SoC Design Conference). https://doi.org/10.1109/ISOCC.2014.7087606