TY - GEN
T1 - Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)
AU - Cho, Keewon
AU - Lee, Woosung
AU - Kim, Jooyoung
AU - Kang, Sungho
PY - 2015/4/16
Y1 - 2015/4/16
N2 - In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.
AB - In general, the external automatic test equipment (ATE) is used to progress a redundancy analysis (RA) process in industrial semiconductor memories. However, many researches have pointed out that a high price of the external ATE can be a huge burden on testing costs. This paper presents a new concept which reduces the failure bitmap size in the external ATE without an any extra hardware overhead. Despite the reduction of the failure bitmap size, converting some parts of the faulty information to a partial solution search tree prevents unwanted yield drops.
UR - http://www.scopus.com/inward/record.url?scp=84929404338&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84929404338&partnerID=8YFLogxK
U2 - 10.1109/ISOCC.2014.7087606
DO - 10.1109/ISOCC.2014.7087606
M3 - Conference contribution
T3 - ISOCC 2014 - International SoC Design Conference
SP - 128
EP - 129
BT - ISOCC 2014 - International SoC Design Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International SoC Design Conference, ISOCC 2014
Y2 - 3 November 2014 through 6 November 2014
ER -