Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift

Mohammad Reza Jafarfard, Behnam Tayebi, Razie Jalali Nasab, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.

Original languageEnglish
Title of host publicationPractical Holography XXIX
Subtitle of host publicationMaterials and Applications
EditorsHans I. Bjelkhagen, V. Michael Bove
PublisherSPIE
ISBN (Electronic)9781628414769
DOIs
Publication statusPublished - 2015 Jan 1
EventPractical Holography XXIX: Materials and Applications - San Francisco, United States
Duration: 2015 Feb 82015 Feb 11

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9386
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPractical Holography XXIX: Materials and Applications
CountryUnited States
CitySan Francisco
Period15/2/815/2/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Jafarfard, M. R., Tayebi, B., Nasab, R. J., & Kim, D. Y. (2015). Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift. In H. I. Bjelkhagen, & V. M. Bove (Eds.), Practical Holography XXIX: Materials and Applications [2078681] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9386). SPIE. https://doi.org/10.1117/12.2078681