Redundancy analysis based on fault distribution for memory with complex spares

Hayoung Lee; Donghyun Han; Seungtaek Lee; Sungho Kang

doi:10.1109/ISOCC47750.2019.9078503

Redundancy analysis based on fault distribution for memory with complex spares

Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

With the development of memory density and capacity, a redundancy analysis (RA) is widely used to improve memory yield. However, as the probability of fault occurrence on memory increases, repair rates of conventional RAs with a simple spare structure have been not enough to achieve a high memory yield. In this paper, redundancy analysis based on fault distribution (RAFD) for memory with complex spares is proposed to address the problem. It can obtain much higher repair rate than using conventional RAs with a simple spare structure by using complex spares. Also, although use of complex spares can cause analysis time increase but, RAFD solves the problem with the sequential spare allocations through consideration of fault distribution.

Original language	English
Title of host publication	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	235-236
Number of pages	2
ISBN (Electronic)	9781728124780
DOIs	https://doi.org/10.1109/ISOCC47750.2019.9078503
Publication status	Published - 2019 Oct
Event	16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of Duration: 2019 Oct 6 → 2019 Oct 9

Publication series

Name	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume	2019-January

Conference

Conference	16th International System-on-Chip Design Conference, ISOCC 2019
Country/Territory	Korea, Republic of
City	Jeju
Period	19/10/6 → 19/10/9

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2019R1A2C3011079).

Publisher Copyright:
© 2019 IEEE.

All Science Journal Classification (ASJC) codes

Signal Processing
Electrical and Electronic Engineering
Instrumentation
Artificial Intelligence
Hardware and Architecture

Access to Document

10.1109/ISOCC47750.2019.9078503

Cite this

Lee, H., Han, D., Lee, S., & Kang, S. (2019). Redundancy analysis based on fault distribution for memory with complex spares. In Proceedings - 2019 International SoC Design Conference, ISOCC 2019 (pp. 235-236). [9078503] (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC47750.2019.9078503

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abstract = "With the development of memory density and capacity, a redundancy analysis (RA) is widely used to improve memory yield. However, as the probability of fault occurrence on memory increases, repair rates of conventional RAs with a simple spare structure have been not enough to achieve a high memory yield. In this paper, redundancy analysis based on fault distribution (RAFD) for memory with complex spares is proposed to address the problem. It can obtain much higher repair rate than using conventional RAs with a simple spare structure by using complex spares. Also, although use of complex spares can cause analysis time increase but, RAFD solves the problem with the sequential spare allocations through consideration of fault distribution.",

author = "Hayoung Lee and Donghyun Han and Seungtaek Lee and Sungho Kang",

note = "Funding Information: This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2019R1A2C3011079). Publisher Copyright: {\textcopyright} 2019 IEEE.; 16th International System-on-Chip Design Conference, ISOCC 2019 ; Conference date: 06-10-2019 Through 09-10-2019",

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language = "English",

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Lee, H, Han, D, Lee, S & Kang, S 2019, Redundancy analysis based on fault distribution for memory with complex spares. in Proceedings - 2019 International SoC Design Conference, ISOCC 2019., 9078503, Proceedings - 2019 International SoC Design Conference, ISOCC 2019, vol. 2019-January, Institute of Electrical and Electronics Engineers Inc., pp. 235-236, 16th International System-on-Chip Design Conference, ISOCC 2019, Jeju, Korea, Republic of, 19/10/6. https://doi.org/10.1109/ISOCC47750.2019.9078503

Redundancy analysis based on fault distribution for memory with complex spares. / Lee, Hayoung; Han, Donghyun; Lee, Seungtaek et al.

Proceedings - 2019 International SoC Design Conference, ISOCC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 235-236 9078503 (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - With the development of memory density and capacity, a redundancy analysis (RA) is widely used to improve memory yield. However, as the probability of fault occurrence on memory increases, repair rates of conventional RAs with a simple spare structure have been not enough to achieve a high memory yield. In this paper, redundancy analysis based on fault distribution (RAFD) for memory with complex spares is proposed to address the problem. It can obtain much higher repair rate than using conventional RAs with a simple spare structure by using complex spares. Also, although use of complex spares can cause analysis time increase but, RAFD solves the problem with the sequential spare allocations through consideration of fault distribution.

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Redundancy analysis based on fault distribution for memory with complex spares

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